http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
https://www.riss.kr/link?id=O138113350
Gerrer, L. ; Cluzel, J. ; Gaillard, F. ; Garros, X. ; Federspiel, X. ; Cacho, F. ; Roy, D. ; Vincent, E.
2021년
eng
1541-7026
학술저널
IEEE International Reliability Physics Symposium proceedings
1-5 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
2021 IEEE International Reliability Physics Symposium (IRPS)
Monteray, CA
0
상세조회0
다운로드
Systematic Study of Process Impact on FinFET Reliability
Moisture diffusion rate in an ultra-low-k dielectric and its effect on the dielectric reliability
Single Event Hard Error due to Terrestrial Radiation
Characterization and Mitigation of Relaxation Effects on Multi-level RRAM based In-Memory Computing