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      Lattice Structure and Bandgap Control of 2D GaN Grown on Graphene/Si Heterostructures

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      https://www.riss.kr/link?id=O120042870

      • 저자
      • 발행기관
      • 학술지명
      • 권호사항
      • 발행연도

        2019년

      • 작성언어

        -

      • Print ISSN

        1613-6810

      • Online ISSN

        1613-6829

      • 등재정보

        SCIE;SCOPUS

      • 자료형태

        학술저널

      • 수록면

        n/a-n/a   [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]

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        • 전북대학교 중앙도서관  
        • 성균관대학교 중앙학술정보관  
        • 부산대학교 중앙도서관  
        • 전남대학교 중앙도서관  
        • 제주대학교 중앙도서관  
        • 중앙대학교 서울캠퍼스 중앙도서관  
        • 인천대학교 학산도서관  
        • 숙명여자대학교 중앙도서관  
        • 서강대학교 로욜라중앙도서관  
        • 계명대학교 동산도서관  
        • 충남대학교 중앙도서관  
        • 한양대학교 백남학술정보관  
        • 이화여자대학교 중앙도서관  
        • 고려대학교 도서관  
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      다국어 초록 (Multilingual Abstract)

      2D group‐III nitride materials have shown a great promise for applications in optoelectronic devices thanks to their thickness‐dependent properties. However, the epitaxial growth of 2D group‐III nitrides remains a challenge. In this work, epitaxial growth of 2D GaN with well‐controlled lattice structures and bandgaps is achieved by plasma‐enhanced metal organic chemical vapor deposition via effective regulation of plasma energy and growth temperature. The structure of graphene/2D GaN/Si heterostructures is carefully investigated by high‐resolution transmission electron microscopy. The formation mechanism of the 2D GaN layer is clearly clarified by theoretical calculations. Furthermore, a bandgap for 2D GaN ranging from ≈4.18 to ≈4.65 eV varying with the numbers of layers is theoretically calculated and experimentally confirmed. 2D GaN with well‐controlled lattice structure and bandgap holds great potential for the development of deep ultraviolet light‐emitting diodes, energy conversion devices, etc.
      2D GaN with well‐controlled lattice structure and bandgap is epitaxially grown by plasma‐enhanced metal organic chemical vapor deposition via effective regulation of plasma energy and growth temperature. The Eg for 2D GaN layers in P63MC (four‐layer) and R3m (six‐layer) structure is determined to be ≈4.65 and ≈4.18 eV, respectively, and the corresponding mechanisms are revealed accordingly.
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      2D group‐III nitride materials have shown a great promise for applications in optoelectronic devices thanks to their thickness‐dependent properties. However, the epitaxial growth of 2D group‐III nitrides remains a challenge. In this work, epitax...

      2D group‐III nitride materials have shown a great promise for applications in optoelectronic devices thanks to their thickness‐dependent properties. However, the epitaxial growth of 2D group‐III nitrides remains a challenge. In this work, epitaxial growth of 2D GaN with well‐controlled lattice structures and bandgaps is achieved by plasma‐enhanced metal organic chemical vapor deposition via effective regulation of plasma energy and growth temperature. The structure of graphene/2D GaN/Si heterostructures is carefully investigated by high‐resolution transmission electron microscopy. The formation mechanism of the 2D GaN layer is clearly clarified by theoretical calculations. Furthermore, a bandgap for 2D GaN ranging from ≈4.18 to ≈4.65 eV varying with the numbers of layers is theoretically calculated and experimentally confirmed. 2D GaN with well‐controlled lattice structure and bandgap holds great potential for the development of deep ultraviolet light‐emitting diodes, energy conversion devices, etc.
      2D GaN with well‐controlled lattice structure and bandgap is epitaxially grown by plasma‐enhanced metal organic chemical vapor deposition via effective regulation of plasma energy and growth temperature. The Eg for 2D GaN layers in P63MC (four‐layer) and R3m (six‐layer) structure is determined to be ≈4.65 and ≈4.18 eV, respectively, and the corresponding mechanisms are revealed accordingly.

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