- ABSTRACT
- 1. 서론
- 2. 평행도 측정
- 3. 평행도 및 진직도 동시측정
- 4. 결론
http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
https://www.riss.kr/link?id=A76287230
2007
Korean
555
SCOPUS,KCI등재
학술저널
117-123(7쪽)
2
0
상세조회0
다운로드목차 (Table of Contents)
참고문헌 (Reference)
1 Furukawa, "Three-Dimensional Slit width Measurement for Long Precision Slot Die" 295 (295): 343-348, 2005.
2 G, "Surface Profile Measurement with a Scanning Differential AC Interferometer" 23-24 : 4544-4553, 1984.
3 Evans, "Self-calibration: Reversal Redundancy Error Separation and Absolute Testing" 45 (45): 617-634, 1996.
4 S, "Profile Measurement of Machined Surface with a New Differential Surface with a New Differential Method" kiyo 16 : 212-218, 1994.
5 Gao, "Precision Nanometrology and Its Applications to Precision Nanosystems" 6 (6): 14-20, 2005.
6 Gao, "Precision Measurement of Cylinder Straightness Using a Scanning Multi-probe System" 26 (26): 279-288, 2002.
7 Gao, "On-machine Measurement of Machined Surface Using the Combined Three-Point Method" 40 (40): 253-259, 1997.
8 Kounosu, "Measurement of Surface Profile Using Smoothed Serial Three Point Method" 61 (61): 641-645, 1995.
9 Yamaguchi, "Measurement of Straight Motion Accuracy Using the Improved Sequential Three-point Method Journal of JSPE" 59 (59): 773-778, 1993.
10 Thalmann, "Intercomparison of parallelism measurements" Measurement 17 : 17-27, 1996.
1 Furukawa, "Three-Dimensional Slit width Measurement for Long Precision Slot Die" 295 (295): 343-348, 2005.
2 G, "Surface Profile Measurement with a Scanning Differential AC Interferometer" 23-24 : 4544-4553, 1984.
3 Evans, "Self-calibration: Reversal Redundancy Error Separation and Absolute Testing" 45 (45): 617-634, 1996.
4 S, "Profile Measurement of Machined Surface with a New Differential Surface with a New Differential Method" kiyo 16 : 212-218, 1994.
5 Gao, "Precision Nanometrology and Its Applications to Precision Nanosystems" 6 (6): 14-20, 2005.
6 Gao, "Precision Measurement of Cylinder Straightness Using a Scanning Multi-probe System" 26 (26): 279-288, 2002.
7 Gao, "On-machine Measurement of Machined Surface Using the Combined Three-Point Method" 40 (40): 253-259, 1997.
8 Kounosu, "Measurement of Surface Profile Using Smoothed Serial Three Point Method" 61 (61): 641-645, 1995.
9 Yamaguchi, "Measurement of Straight Motion Accuracy Using the Improved Sequential Three-point Method Journal of JSPE" 59 (59): 773-778, 1993.
10 Thalmann, "Intercomparison of parallelism measurements" Measurement 17 : 17-27, 1996.
11 Gao, "High Precision Measurement of Rotational Accuracy" 21 (21): 7-13, 2004.
12 Gao, "High Accuracy Profile Measurement of a Machined Surface by the Combined Method" Measurement 19 (19): 55-64, 1996.
13 Tanaka, "Extensive Analysis and Development of Straightness Measurement by Sequential Two-point Method Transaction of the ASME Journal of Engineering for Industry" 108 : 176-182, 1986.
14 Estler, "Calibration and Use of Optical StraightEdges in the Metrology of Precision Machines" 24 : 372-379, 1985.
15 Tanaka, "Application of a NewStraightness Measurement Method to Large machine Tools Annals of the CIRP" 30 : 455-459, 1981.
16 Fung, "An Approach to On-Machine Motion Error Measurement of a Linear Slide" Measurement 29 : 51-62, 2001.
17 K, "A new Method for the Measurement of the Straightness of Machine Tools and Machined Work ASME Journal of Mechanical Design" 104 : 587-592, 1982.
18 Donaldson, "A Simple Method for Separating Spindle Error from Test Ball Roundness Error" 21 : 125-126, 1972.
링배열 펄스레이저 조사에 의한 파장매칭형 배관 유도초음파의 비접촉 발생과 검출
학술지 이력
연월일 | 이력구분 | 이력상세 | 등재구분 |
---|---|---|---|
2023 | 평가예정 | 해외DB학술지평가 신청대상 (해외등재 학술지 평가) | |
2020-01-01 | 평가 | 등재학술지 유지 (해외등재 학술지 평가) | |
2013-01-01 | 평가 | 등재학술지 유지 (등재유지) | |
2010-01-01 | 평가 | 등재학술지 유지 (등재유지) | |
2008-06-23 | 학회명변경 | 영문명 : Korean Society Of Precision Engineering -> Korean Society for Precision Engineering | |
2008-01-01 | 평가 | 등재학술지 유지 (등재유지) | |
2006-07-07 | 학술지명변경 | 외국어명 : 미등록 -> Journal of the Korean Society for Precision Engineering | |
2006-01-01 | 평가 | 등재학술지 유지 (등재유지) | |
2004-01-01 | 평가 | 등재학술지 유지 (등재유지) | |
2001-01-01 | 평가 | 등재학술지 선정 (등재후보2차) | |
1998-07-01 | 평가 | 등재후보학술지 선정 (신규평가) |
학술지 인용정보
기준연도 | WOS-KCI 통합IF(2년) | KCIF(2년) | KCIF(3년) |
---|---|---|---|
2016 | 0.26 | 0.26 | 0.26 |
KCIF(4년) | KCIF(5년) | 중심성지수(3년) | 즉시성지수 |
0.24 | 0.22 | 0.449 | 0.12 |