<P>We propose dual-wavelength Fourier ptychography for topographic measurement. To extend the axial measurement range, a single light-emitting diode (LED) and two appropriate bandpass filters are employed. This provides a spedde-free phase image...
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https://www.riss.kr/link?id=A107463959
2018
-
SCI,SCIE,SCOPUS
학술저널
3526
0
상세조회0
다운로드다국어 초록 (Multilingual Abstract)
<P>We propose dual-wavelength Fourier ptychography for topographic measurement. To extend the axial measurement range, a single light-emitting diode (LED) and two appropriate bandpass filters are employed. This provides a spedde-free phase image...
<P>We propose dual-wavelength Fourier ptychography for topographic measurement. To extend the axial measurement range, a single light-emitting diode (LED) and two appropriate bandpass filters are employed. This provides a spedde-free phase image, and reduces the possibility of a systematic error, which yields a high-quality topographic image. The proposed system can measure the surface topography in the range of nano- to micro-structures. The performance of the system is experimentally verified. (C) 2018 Optical Society of America</P>
Self-assembled stretchable photonic crystal for a tunable color filter