- CONTENTS
- 1 Introduction - Measurement Techniques and Applications / Bharat Bhushan = 1
- Part Ⅰ Scanning Probe Microscopy
- 2 Scanning Probe Microscopy - Principle of Operation, Instrumentation, and Probes / Bharat Bhushan ; Othmar Marti = 33
- 3 Calibration of Normal and Lateral Forces in Cantilevers Used in Atomic Force Microscopy / Manuel L.B. Palacio ; Bharat Bhushan = 95