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WE-AM-1-1 The PCB Level ESD Immunity Study by using 3 Dimension ESD Scan System
Wang, K.; Pommerenke, D.; Zhang, J. M.; Chundru, R. IEEE; 1998 2004 p.343-348
WE-AM-1-2 Emission and Immunity Testing: Test Object Electrical Size and Its Implication
Wilson, P. IEEE; 1998 2004 p.349-352
Lourdel, G.; Dienot, J.-M. IEEE; 1998 2004 p.353-356
Ando, N.; Masuda, N.; Tamaki, N.; Kuriyama, T.; Saito, S.; Kato, K.; Ohashi, K.; Saito, M.; Yamaguchi, M. IEEE; 1998 2004 p.357-362
WE-AM-1-5 A Novel Concept for Measuring the Transient Electromagnetic Fields with Unknown Amplitude
Mahanfar, A. IEEE; 1998 2004 p.363-366
WE-AM-1-6 Near Field Measurement of LF Loop Transmitters
Brunett, J. D.; Liepa, V. V. IEEE; 1998 2004 p.367-371
Vrigno, B.; Bendhia, S.; Courau, L.; Sicard, E. IEEE; 1998 2004 p.372-376
WE-AM-2-1 A Time Domain Approach to Estimate Current Draw from SMT Decoupling Capacitors
Zhang, L.; Archambeault, B.; Conner, S.; Knighten, J. L.; Fan, J.; Smith, N. W.; Alexander, R.; DuBroff, R. E.; Drewniak, J. L. IEEE; 1998 2004 p.377-382
WE-AM-2-2 On the Parameterization of the Cross-talk in Printed Circuit Board Traces
Mahanfar, A. IEEE; 1998 2004 p.383-385
WE-AM-2-3 Via Coupling within Power-Return Plane Structures Considering the Radiation Loss
Chen, R. L.; Chen, J.; Hubing, T. H.; Shi, W. IEEE; 1998 2004 p.386-391