Resonant inelastic X-ray scattering of tantalum double perovskite structures

다국어 초록 (Multilingual Abstract)

In this paper, we investigated the electronic structures and defect states of SrLaMgTaO6 (SLMTO) double perovskite structures by using resonant inelastic x-ray scattering. Recently, Eu3+ doped SLMTO red phosphors have been vigorously investigated due to their higher red emission efficiency compared to commercial white light emitting diodes (W-LED). However, a comprehensive understanding on the electronic structures and defect states of host SLMTO compounds, which are specifically related to the W-LED and photoluminescence (PL), is far from complete. Here, we found that the PL spectra of SLMTO powder compounds sintered at a higher temperature, 1400 °C, were weaker in the blue emission regions (at around 400 nm) and became enhanced in near infrared (NIR) regions compared to those sintered at 1200 °C. To elucidate the difference of the PL spectra, we performed resonant inelastic x-ray spectroscopy (RIXS) at Ta L-edge. Our RIXS result implies that the microscopic origin of different PL spectra is not relevant to the Ta-related defects and oxygen vacancies.

참고문헌 (Reference)

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