Physical device scaling of traditional silicon metal-oxide-semiconductor field-effect transistors (MOSFETs) has driven progress in computing for decades; however, continued scaling is become increasingly difficult. Consequently, there is a need for mi...
Physical device scaling of traditional silicon metal-oxide-semiconductor field-effect transistors (MOSFETs) has driven progress in computing for decades; however, continued scaling is become increasingly difficult. Consequently, there is a need for minimiture the integrated circuit beyond-silicon nanotechnologies. Besides, ever since the discovery of carbon nanotube (CNT), graphene and transition metal dichalcogenide (TMD), 1D-2D layered materials as the platforms for exploiting the extraordinary properties in the low-dimensional physics. Owing to their small diameter (CNT), thin, flat and a dangling-bond-free surface, which will interact each other through van der Waals (vdW) forces and promise an order-of-magnitude improvement in device performance. However, it remains a challenge to produce the vertical configuration of mix-dimensional heterostructures over large-scale areas with high quality. In particular, graphene electrode cannot perform as below 10 nm scaled electrodes due to the band gap opening in graphene nanoribbon. Together, graphene electrode in vertical-field-effect-transistor (VFET), which possess the screening effect by the bottom gate-induced modulation, resulting to low on/off current ratio. On the other hand, CNT is commercialized materials with small range of diameter (1-2 nm), which is not only increasing the number of devices in the integrated circuit but also can enhance the device performance owing to low screening effect. In this dissertation, the systematically study the screening effect on VFET was discussed, while also highlight the improving the device scaling limits of integration circuits.
In Chapter 1, 1D-2D materials structures and properties are briefly reviewed. In chapter 2, the screening effect was systematically study with CNT (1D)/MoS2 (2D) VFET. In this topic, a screening-engineered CNT network/MoS2/metal heterojunction CNT-VFET is fabricated for an efficient gate modulation independent of the drain voltage. In Chapter 3, for further increasing the number of devices in future integrated circuit, we proposed and demonstrated the vertical memristor by constructing the CNT (1D) and single molecule (0D). In chapter 4, we systematically study the screening effect on the interface-doped between ZnO /others oxide heterojunctions. Finally, the perspectives from my personal point of view in vdW heterostructure are covered by the Chapter 5.