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https://www.riss.kr/link?id=O38243657
Aljancic, U. ; Resnik, D. ; Vrtacnik, D. ; Mozek, M. ; Topic, M. ; Smole, F. ; Amon, S.
2000년
eng
학술저널
INTERNATIONAL CONFERENCE ON MICROELECTRONICS DEVICES AND MATERIALS
145-149 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
9619000188
Microelectronics devices and materials
International conference
Postojna, Slovenia
2000; Oct
0
상세조회0
다운로드
Recent Developments in Silicon Radiation Detectors at IRST
Diagnostics of Nonlinearity of Current vs. Voltage Characteristics-Theory and Applications
Materials Characterization by Auger Electron Spectroscopy Sputter Depth Profiling
Characterization of Dielectrics on the "Tips of Needles"