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      KCI등재 SCIE SCOPUS

      Thermal deformation analysis of tabbed solar cells using solder alloy and conductive film

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      https://www.riss.kr/link?id=A107042769

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      다국어 초록 (Multilingual Abstract)

      Finite element analysis (FEA) has been carried out with the aim of understanding the thermal deformation characteristics of two solar cell configurations. One of the solar cell models is tabbed by lead-free solder, the other model by Conductive film (...

      Finite element analysis (FEA) has been carried out with the aim of understanding the thermal deformation characteristics of two solar cell configurations. One of the solar cell models is tabbed by lead-free solder, the other model by Conductive film (CF). A high temperature soldering process could weaken the bond and reduce the reliability of the cells because of the residual stress caused by the different thermal expansion coefficients of the materials. Moreover, solar irradiation generates temperature distribution across the surface of the solar cell, and the development of solar cells made of thinner crystalline silicon wafers will lead to the reduction in manufacturing costs.

      In this study, Finite element analysis (FEA) of the manufacturing process has been carried out using both solder and CF bonding. Three temperature cycles were applied to analyze different environmental operating conditions and understand how thermal cycles affect the residual stress during actual service conditions. This investigation provides a comparison of thermal deformations between solder and CF bonded solar cells in order to understand which offers substantial reliability in the long term. Also this study explores the effects of various thicknesses of the silicon wafer on the residual stress and deformation of the solar cells.

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      참고문헌 (Reference)

      1 J. W. Kim, "Thermal degradation of anisotropic conductive film joints under temperature fluctuation" 28 : 314-320, 2008

      2 J. W. Kim, "Thermal degradation of anisotropic conductive film joints under temperature fluctuation" 28 : 314-320, 2008

      3 M. L. Williams, "The temperature dependence of relaxation mechanisms in amorphous polymers and other glass-forming liquids" 77 (77): 3701-3707, 1955

      4 J. Wendt, "The link between mechanical stress induced by soldering and micro damages in silicon solar cells" 2009

      5 Y. Zemen, "The impact of yield strength of the interconnector on the internal stress of the solar cell within a module" 4073-4078, 2010

      6 M. J. Rizvi, "Study of anisotropic conductive adhesive joint behavior under 3-point bending" 45 : 589-596, 2005

      7 P. Rupnowski, "Strength of silicon wafers : fracture mechanics approach" 155 : 67-74, 2009

      8 A. M. Gabor, "Soldering induced damage to thin si solar cells and detection of cracked cells in modules" 2006

      9 C. H. Chen, "Residual stress and bow analysis for silicon solar cell induced by soldering" 2008

      10 P. Chen, "Relationship between wafer fracture reduction and controlling during the edge manufacturing process" 87 : 1809-1815, 2010

      1 J. W. Kim, "Thermal degradation of anisotropic conductive film joints under temperature fluctuation" 28 : 314-320, 2008

      2 J. W. Kim, "Thermal degradation of anisotropic conductive film joints under temperature fluctuation" 28 : 314-320, 2008

      3 M. L. Williams, "The temperature dependence of relaxation mechanisms in amorphous polymers and other glass-forming liquids" 77 (77): 3701-3707, 1955

      4 J. Wendt, "The link between mechanical stress induced by soldering and micro damages in silicon solar cells" 2009

      5 Y. Zemen, "The impact of yield strength of the interconnector on the internal stress of the solar cell within a module" 4073-4078, 2010

      6 M. J. Rizvi, "Study of anisotropic conductive adhesive joint behavior under 3-point bending" 45 : 589-596, 2005

      7 P. Rupnowski, "Strength of silicon wafers : fracture mechanics approach" 155 : 67-74, 2009

      8 A. M. Gabor, "Soldering induced damage to thin si solar cells and detection of cracked cells in modules" 2006

      9 C. H. Chen, "Residual stress and bow analysis for silicon solar cell induced by soldering" 2008

      10 P. Chen, "Relationship between wafer fracture reduction and controlling during the edge manufacturing process" 87 : 1809-1815, 2010

      11 P. Chen, "Relationship between wafer fracture reduction and controlling during the edge manufacturing process" 87 : 1809-1815, 2010

      12 P. Chen, "Relationship between wafer edge design and its ultimate mechanical strength" 87 : 2065-2070, 2010

      13 최성호, "Real-time detection of surface cracks on silicon wafers during laser beam irradiation" 대한기계학회 29 (29): 39-43, 2015

      14 C. Funke, "Modeling the tensile strength and crack length of wire-sawn silicon wafers" 131 (131): 011012-011016, 2009

      15 A. Fischera, "Mechanical strength of 300 mm diameter silicon wafers at high temperatures:modeling and simulation" 45 : 209-223, 1999

      16 W. N. Sharpe, "Measurements of young’s modulus, poisson’s ratio, and tensile strength of polysilicon" 424-429, 1997

      17 K. Ohguchi, "Investigation of effect of creep strain on low-cycle fatigue of lead-free solder by cyclic loading using stepped ramp waves" 132 : 041010-041011, 2010

      18 P. Grunow, "Influence of micro cracks in multi-crystalline silicon solar cells on the reliability of PV modules" 2380-2383, 2005

      19 P. A. Wang, "Industrial challenges for thin wafer manufacturing, Proc" 1179-1182, 2006

      20 P. A. Wang, "Industrial challenges for thin wafer manufacturing" 1179-1182, 2006

      21 W. J. Liu, "Finite element analysis for grinding and lapping of wire-sawn silicon wafers" 129 : 2-9, 2002

      22 "Factual database on tensile and low cycle fatigue properties of Sn-37Pb and Sn-3.5Ag solders" The Society of Materials Science 2001

      23 Yeong-Shu Chen, "Efficiency improvement of the highly accelerated life testing system by using multiple hammers" 대한기계학회 28 (28): 4815-4831, 2014

      24 V. A. Popovich, "Effect of silicon solar cell processing parameters and crystallinity on mechanical strength" 95 : 97-100, 2011

      25 C. Lai, "Analysis of the thermal stress and warpage induced by soldering in monocrystalline silicon cells" 55 : 7-16, 2013

      26 X. F. Brun, "Analysis of stresses and breakage of crystalline silicon wafers during handling and transport" 93 : 1238-1247, 2009

      27 L. Bittoni, "Aluminum pastes suitable for wide range thin crystalline silicon solar cells processing blistering and bowing effects reduction" 818-821, 2006

      28 K. Ohguchi, "A quantitative evaluation of time-independent and time-dependent deformations of lead-free and lead-containing solder alloys" 35 (35): 132-139, 2006

      29 S. Bhagavata, "A finite element analysis of temperature variation in silicon wafers during wiresaw slicing" 48 : 95-106, 2008

      30 L. Yu, "3D FEM for sintering of solar cell with boron back surface field based on solidwork simulation" 81-86, 2012

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2012-11-05 학술지명변경 한글명 : 대한기계학회 영문 논문집 -> Journal of Mechanical Science and Technology KCI등재
      2010-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2008-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2006-01-19 학술지명변경 한글명 : KSME International Journal -> 대한기계학회 영문 논문집
      외국어명 : KSME International Journal -> Journal of Mechanical Science and Technology
      KCI등재
      2006-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2004-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2001-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      1998-07-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 1.04 0.51 0.84
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.74 0.66 0.369 0.12
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