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https://www.riss.kr/link?id=O39148258
2000년
eng
1063-6722
학술저널
IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS
257-265 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
0769507190; 0769507212; 0769507204
Defect and fault tolerance in VLSI systems
International symposium
Yamanashi, Japan
2000; Oct
0
상세조회0
다운로드
The Effect of Placement on Yield for Standard Cell Designs
IC Critical Volume Calculation through Ray-Casting of CSG Trees
A New Defect Outline Model Used for Critical Area Estimation in VLSI
Predicting the Yield Efficacy of a Defect-Tolerant Embedded Core