RISS 학술연구정보서비스

검색
다국어 입력

http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.

변환된 중국어를 복사하여 사용하시면 됩니다.

예시)
  • 中文 을 입력하시려면 zhongwen을 입력하시고 space를누르시면됩니다.
  • 北京 을 입력하시려면 beijing을 입력하시고 space를 누르시면 됩니다.
닫기
    인기검색어 순위 펼치기

    RISS 인기검색어

      KCI등재 SCI SCIE SCOPUS

      Surface Charge on Ferroelectric Thin Film by the High Electric Field Induced at Scanning Probe Microscope Tip

      한글로보기

      https://www.riss.kr/link?id=A104322610

      • 0

        상세조회
      • 0

        다운로드
      서지정보 열기
      • 내보내기
      • 내책장담기
      • 공유하기
      • 오류접수

      부가정보

      다국어 초록 (Multilingual Abstract)

      We report the surface charge on ferroelectric thin film by the high electric field induced at a scanning probe microscope tip and its influence on the signal obtained in the measurement of surface potential. To calculate the electric field induced ...

      We report the surface charge on ferroelectric thin film by the
      high electric field induced at a scanning probe microscope tip and
      its influence on the signal obtained in the measurement of surface
      potential. To calculate the electric field induced at a SPM tip
      when a domain of the ferroelectric thin film is switched by a
      given bias, two schematic models of a spherical SPM tip and a
      cone-shaped SPM tip are considered. For the cone-shaped SPM tip,
      the electric field was larger than that of the spherical SPM tip,
      which is probably due to its relatively high capacitance. Based on
      the consideration of Schottky emission, the Schottky currents of
      the two models showed values large enough to induce a charge on
      the surface of the ferroelectric thin film. From the Schottky
      currents, the induced charge densities of the two models were
      obtained and these induced charge densities exceed the charge
      density of saturated polarization in ferroelectric
      PbZr$_{0.53}$Ti$_{0.47}$O$_{3}$ thin film above 1.1 V for the
      cone-shaped SPM tip or 2.0 V for the spherical SPM tip

      더보기

      다국어 초록 (Multilingual Abstract)

      We report the surface charge on ferroelectric thin film by the high electric field induced at a scanning probe microscope tip and its influence on the signal obtained in the measurement of surface potential. To calculate the electric field induced...

      We report the surface charge on ferroelectric thin film by the high electric field induced at a scanning probe microscope tip and its influence on the signal obtained in the measurement of surface potential. To calculate the electric field induced at a SPM tip when a domain of the ferroelectric thin film is switched by a given bias, two schematic models of a spherical SPM tip and a cone-shaped SPM tip are considered. For the cone-shaped SPM tip, the electric field was larger than that of the spherical SPM tip, which is probably due to its relatively high capacitance. Based on the consideration of Schottky emission, the Schottky currents of the two models showed values large enough to induce a charge on the surface of the ferroelectric thin film. From the Schottky currents, the induced charge densities of the two models were obtained and these induced charge densities exceed the charge density of saturated polarization in ferroelectric PbZr0.53Ti0.47O3 thin film above 1.1 V for the cone-shaped SPM tip or 2.0 V for the spherical SPM tip.

      더보기

      참고문헌 (Reference)

      1 J. F. Scott, "Feroelectric Memories" Springer-Verlag,Germany 2000

      1 J. F. Scott, "Feroelectric Memories" Springer-Verlag,Germany 2000

      더보기

      동일학술지(권/호) 다른 논문

      동일학술지 더보기

      더보기

      분석정보

      View

      상세정보조회

      0

      Usage

      원문다운로드

      0

      대출신청

      0

      복사신청

      0

      EDDS신청

      0

      동일 주제 내 활용도 TOP

      더보기

      주제

      연도별 연구동향

      연도별 활용동향

      연관논문

      연구자 네트워크맵

      공동연구자 (7)

      유사연구자 (20) 활용도상위20명

      인용정보 인용지수 설명보기

      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2007-01-01 평가 SCI 등재 (등재유지) KCI등재
      2005-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2002-07-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2000-01-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
      더보기

      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.47 0.15 0.31
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.26 0.2 0.26 0.03
      더보기

      이 자료와 함께 이용한 RISS 자료

      나만을 위한 추천자료

      해외이동버튼