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https://www.riss.kr/link?id=O46527339
Alameh, K. ; Bouzerdoum, A. ; Ahderom, S. ; Raisi, M. ; Eshraghian, K. ; Zhao, X. ; Zheng, R. ; Wang, Z.
2004년
eng
학술저널
IEEE INTERNATIONAL WORKSHOP ON ELECTRONIC DESIGN, TEST AND APPLICATIONS
387-390 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
0769520812 (pbk.)
International workshop on electronic design, test and applications; DELTA 2004
2nd
Perth, Australia
2004; Jan
0
상세조회0
다운로드
Hybrid BIST Optimization for Core-Based Systems with Test Pattern Broadcasting
Testability Issues in Superconductor Electronics
Frequency Domain Testing of General Purpose Processors at the Instruction Execution Level