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      KCI등재 SCOPUS SCIE

      Sensitivity of time‐resolved diffraction data to changes in internuclear distances and atomic positions

      한글로보기

      https://www.riss.kr/link?id=A108075420

      • 저자

        Jeong Haeyun (Department of Chemistry and KI for the BioCentury Korea Advanced Institute of Science and Technology (KAIST) Daejeon Republic of Korea) ;  Ki Hosung (Department of Chemistry and KI for the BioCentury Korea Advanced Institute of Science and Technology (KAIST) Daejeon Republic of KoreaCenter for Advanced Reaction Dynamics Institute for Basic Science (IBS) Daejeon Republic of Korea) ;  Kim Jong Goo (Department of Chemistry and KI for the BioCentury Korea Advanced Institute of Science and Technology (KAIST) Daejeon Republic of KoreaCenter for Advanced Reaction Dynamics Institute for Basic Science (IBS) Daejeon Republic of Korea) ;  Kim Jungmin (Department of Chemistry and KI for the BioCentury Korea Advanced Institute of Science and Technology (KAIST) Daejeon Republic of KoreaCenter for Advanced Reaction Dynamics Institute for Basic Science (IBS) Daejeon Republic of Korea) ;  Lee Yunbeom (Department of Chemistry and KI for the BioCentury Korea Advanced Institute of Science and Technology (KAIST) Daejeon Republic of KoreaCenter for Advanced Reaction Dynamics Institute for Basic Science (IBS) Daejeon Republic of Korea) ;  Ihee Hyotcherl (Department of Chemistry and KI for the BioCentury Korea Advanced Institute of Science and Technology (KAIST) Daejeon Republic of KoreaCenter for Advanced Reaction Dynamics Institute for Basic Science (IBS) Daejeon Republic of Korea) 연구자관계분석

      • 발행기관
      • 학술지명
      • 권호사항
      • 발행연도

        2022

      • 작성언어

        English

      • 주제어
      • 등재정보

        KCI등재,SCOPUS,SCIE

      • 자료형태

        학술저널

      • 수록면

        376-390(15쪽)

      • KCI 피인용횟수

        0

      • DOI식별코드
      • 제공처
      • 소장기관
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      부가정보

      다국어 초록 (Multilingual Abstract)

      Time-resolved x-ray liquidography (TRXL) is a powerful technique to study molecular structural dynamics in the solution phase. Typically, a TRXL experiment is conducted during limited beamtime at a beamline of a synchrotron or an x-ray free-electron l...

      Time-resolved x-ray liquidography (TRXL) is a powerful technique to study molecular structural dynamics in the solution phase. Typically, a TRXL experiment is conducted during limited beamtime at a beamline of a synchrotron or an x-ray free-electron laser, demanding a proper design and careful planning.
      In this regard, the optimal q range needs to be determined to find the optimal x-ray energy and sample-to-detector distance. For such purpose, here, we present effective ways to quantify the sensitivity of the TRXL data as a function of q to various factors such as the atomic positions, internuclear distances, solvent cage, and bulk solvent. The developed approaches are also applicable to other types of time-resolved diffraction, such as ultrafast electron diffraction.

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      참고문헌 (Reference)

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      3 H. Ki, 68 : 473-, 2017

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      4 J. G. Kim, 54 : 1685-, 2021

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      96 Jun Ha Kim ; Byoungseok Min ; Young Duck Yun ; Hyeong Joo Choi ; 진경식, "Size-Exclusion Chromatography Coupled with Small-Angle X-Ray Scattering on the 4C Small-Angle X-Ray Scattering Beamline at Pohang Light Source II" 대한화학회 41 (41): 1052-1055, 2020

      97 Ga-Eun Lee ; Mi-Ri Shin ; 강한영, "Ring-opening of cis-3-Substituted-2-vinylaziridines with Heteroatom Nucleophiles" 대한화학회 35 (35): 695-696, 2014

      98 김호중 ; 조성 ; 박정수, "Columnar Liquid Crystalline Self-Assembly of Hydrogen-Bonded Rod–Coil Diblock Complexes Created from Pyrazole/Benzoic acid Derivatives" 대한화학회 36 (36): 2740-2745, 2015

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2008-01-01 평가 SCI 등재 (기타) KCI등재
      2006-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2004-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2001-07-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      1998-01-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.58 0.11 0.38
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.28 0.23 0.213 0.04
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