http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
A Test Structure for Monitoring Micro-Loading Effect of MOSFET Gate Length
Choi, J.-S.; Chung, I.-S. IEEE 1996 p.5-8
Hybrid Optical-Electrical Overlay Test Structure
Cresswell, M. W.; Allen, R. A.; Linholm, L. W.; Guthrie, W. F. IEEE 1996 p.9-12
Narrow Width Effects in CMOS n(p)-well Resistors
Auricchio, C.; Bez, R.; Grossi, A. IEEE 1996 p.13-16
Matching of MOS Transistors with Different Layout Styles
Bastos, J.; Steyaert, M.; Graindourze, B.; Sansen, W. IEEE 1996 p.17-20
Matching Properties of MOS Transistors and Delay Line Chains with Self-Aligned Source/Drain Contacts
Bolt, M.; Cantatore, E.; Socha, M.; Aussems, C. IEEE 1996 p.21-26
Influence of Die Attachment on MOS Transistor Matching
Bastos, J.; Steyaert, M.; Graindourze, B.; Sansen, W. IEEE 1996 p.27-32
Automated extraction of Matching Parameters for Bipolar Transistor Technologies
Connor, S. D.; Evanson, D. IEEE 1996 p.33-38
Characterizing the Mismatch of Submicron MOS Transistors
Lovett, S. J.; Clancy, R.; Welten, M.; Mathewson, A. IEEE 1996 p.39-42
On Matching Properties and Process Factors for Submicrometer CMOS
Wong, S. C.; Pan, K. H.; Ma, D. J.; Liang, M. S. IEEE 1996 p.43-50
Test Structure to Measure the Gate-Drain Coupling Capacitor Using Accelerated Techniques
Manku, T. IEEE 1996 p.51-54