GaN single crystal were grown on the vertical and horizontal reactors by the hydride vapour phase epitaxy (HVPE). The structural and optical characteristics of the GaN single crystal were investigated depending on the reactor type. The threading dislo...
GaN single crystal were grown on the vertical and horizontal reactors by the hydride vapour phase epitaxy (HVPE). The structural and optical characteristics of the GaN single crystal were investigated depending on the reactor type. The threading dislocations were observed starting from the GaN/sapphire interface and propagating within the GaN layer. In case of horizontal HVPE grown GaN were these dislocations were penetrate to the surface. however, vertical HVPE grown GaN were these dislocations were merge together. Etch pit density of two kinds of the GaN films were calculated to be approximately l.4 x 107 and l.2 x 106 cm_2 for GaN layers grown on horizontal and vertical reactors, respectively. double crystal x-ray rocking curve of the (0002) diffraction of the GaN film is found to have a full width at half maximum (FWHM) of 262 and 187 acrsec respectively. The variation of PL spectra and intensity are observed band edge transition at 3.39 eV. It is recognized that GaN grown in the vertical reactor showed a higher PL intensity. In addition, defect related YL bands are seen.
3 mm thickness grown by hydride vapor phase epitaxy and cut using a wire saw to produce freestanding wafers. These wafers then were, mechanically polished with diamond slurry and followed with chemical mechanical polishing for final surface preparation. Surface morphology were examined before and after thermal annealing process performed at 700, 800, 900, and 1000 °C for one hour, in air. Wafers with optimum surface quality submitted to thermal annealing treatment at 900°C were,
characterized by reduced scratched density and residual stress, and surface roughness of 0.096 nm. Surface quality improvement was confirmed by relatively large recovering of the room temperature near band edge luminescence intensity.