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https://www.riss.kr/link?id=O54245087
2010년
eng
2166-2746
2166-2754
SCIE
학술저널
JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY B MICROELECTRONICS AND NANOMETER STRUCTURES
C4E12 [※수록면이 p5 이하이면, Review, Columns, Editor's Note, Abstract 등일 경우가 있습니다.]
Noncontact atomic force microscopy; NC-AFM 2009
INTERNATIONAL CONFERENCE; 12th
New Haven, CT
2009; Aug
0
상세조회0
다운로드
Visualizing contact line phenomena on microstructured superhydrophobic surfaces
Development of ion sources from ionic liquids for microfabrication
Method to obtain nonuniformity information from field emission behavior
Effect of energetic ions on plasma damage of porous SiCOH low-k materials