<P><B>Abstract</B></P><P>The current–voltage (<I>I</I>–<I>V</I>) curves and the captured electron density with various trap densities and maximum applied voltages of organic bistable de...
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https://www.riss.kr/link?id=A107594237
2010
-
KCI등재,SCIE,SCOPUS
학술저널
42-45(4쪽)
0
상세조회0
다운로드다국어 초록 (Multilingual Abstract)
<P><B>Abstract</B></P><P>The current–voltage (<I>I</I>–<I>V</I>) curves and the captured electron density with various trap densities and maximum applied voltages of organic bistable de...
<P><B>Abstract</B></P><P>The current–voltage (<I>I</I>–<I>V</I>) curves and the captured electron density with various trap densities and maximum applied voltages of organic bistable devices (OBDs) were calculated by using the Shockley-Reed trapping rate model and taking into account the thermionic emission model. The current bistabilities in the <I>I</I>–<I>V</I> curves for OBDs were attributed to captured electrons in the traps near the heterointerface between the electrode and the organic layer. The on/off ratio and the width of the memory window of the <I>I</I>–<I>V</I> curves for OBDs gradually increased with increasing trap density in the organic layer and maximum applied voltage. The maximum increase of the on/off ratio and the width of the memory window of the <I>I</I>–<I>V</I> curve for OBDs became saturated to the specific values, regardless of the continuous increase of the trap density and the maximum applied voltage.</P>
Effect of growth temperature on the ZnO nanowires prepared by thermal heating of Zn powders