Exact and approximate mathematical formulas of equatorial aberration for powder diffraction data collected with an Si strip X‐ray detector in continuous‐scan integration mode are presented. An approximate formula is applied to treat the experiment...
Exact and approximate mathematical formulas of equatorial aberration for powder diffraction data collected with an Si strip X‐ray detector in continuous‐scan integration mode are presented. An approximate formula is applied to treat the experimental data measured with a commercial powder diffractometer.
Exact and approximate formulas for equatorial aberration of a continuous‐scan Si strip detector are compared.