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      KCI등재후보 SCIE SCOPUS

      Introduction to Industrial Applications of Low Power Design Methodologies

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      https://www.riss.kr/link?id=A76604171

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      다국어 초록 (Multilingual Abstract)

      Moore’s law has driven silicon technology scale down aggressively, and it results in significant increase of leakage current on nano-meter scale CMOS. Especially, in mobile devices, leakage current has been one of designers’ main concerns, and thus many studies have introduced low power methodologies. However, there are few studies to minimize implementation cost in the mixed use of the methodologies to the best of our knowledge. In this paper, we introduce industrial applications of low power design methodologies for the decrease of leakage current. We focus on the design cost reduction of power gating and reverse body bias when used together. Also, we present voltage scale as an alternative to reverse body bias. To sustain gate leakage current, we discuss the adoption of high-κ metal gate, which cuts gate leakage current by a factor of 10 in 32 ㎚ CMOS technology. A 45 ㎚ mobile SoC is shown as the case study of the mixed use of low power methodologies.
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      Moore’s law has driven silicon technology scale down aggressively, and it results in significant increase of leakage current on nano-meter scale CMOS. Especially, in mobile devices, leakage current has been one of designers’ main concerns, and thu...

      Moore’s law has driven silicon technology scale down aggressively, and it results in significant increase of leakage current on nano-meter scale CMOS. Especially, in mobile devices, leakage current has been one of designers’ main concerns, and thus many studies have introduced low power methodologies. However, there are few studies to minimize implementation cost in the mixed use of the methodologies to the best of our knowledge. In this paper, we introduce industrial applications of low power design methodologies for the decrease of leakage current. We focus on the design cost reduction of power gating and reverse body bias when used together. Also, we present voltage scale as an alternative to reverse body bias. To sustain gate leakage current, we discuss the adoption of high-κ metal gate, which cuts gate leakage current by a factor of 10 in 32 ㎚ CMOS technology. A 45 ㎚ mobile SoC is shown as the case study of the mixed use of low power methodologies.

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      목차 (Table of Contents)

      • Abstract
      • Ⅰ. INTRODUCTION
      • Ⅱ. POWER GATING
      • Ⅲ. REVERSE BODY BIASING
      • Ⅳ. ADAPTIVE VOLTAGE SCALING
      • Abstract
      • Ⅰ. INTRODUCTION
      • Ⅱ. POWER GATING
      • Ⅲ. REVERSE BODY BIASING
      • Ⅳ. ADAPTIVE VOLTAGE SCALING
      • Ⅴ. HIGH-k METAL GATE
      • Ⅵ. CASE STUDY: LEAKAGE REDUCTION IN 45 NM COMMERCIAL MOBILE SOC
      • Ⅶ. CONCLUSIONS
      • REFERENCES
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      참고문헌 (Reference)

      1 H. F. Jyu, "Statistical timing analysis of combinational circuits" 1 (1): 126-137, 1993

      2 J. Jeong, "Statistical mixed Vt allocation of body-biased circuits for reduced leakage variation" 629-634, 2008

      3 R. Rao, "Statistical analysis of subthreshold leakage current for VLSI circuits" 12 (12): 131-139, 2004

      4 L. T. Clark, "Reversebody bias and supply collapse for low effective standby power" 12 (12): 947-956, 2004

      5 H.-O. Kim, "Physical design methodology of power gating circuits for standard-cell-based design" 109-113, 2006

      6 S. Borkar, "Parameter variations and impact on circuits and microarchitecture" 338-342, 2003

      7 B. Choi, "Lookup table-based adaptive body biasing of multiple macros" 533-538, 2007

      8 J.Y. Choi, "Lookup table based adaptive body biasing of multiple macros"

      9 S. G. Narendra, "Leakage in nanometer CMOS technologies" Springer- Verlag 2005

      10 K. Roy, "Leakage current mechanisms and leakage reduction techniques in deep-submicronmeter CMOS circuits" 92 (92): 305-327, 2003

      1 H. F. Jyu, "Statistical timing analysis of combinational circuits" 1 (1): 126-137, 1993

      2 J. Jeong, "Statistical mixed Vt allocation of body-biased circuits for reduced leakage variation" 629-634, 2008

      3 R. Rao, "Statistical analysis of subthreshold leakage current for VLSI circuits" 12 (12): 131-139, 2004

      4 L. T. Clark, "Reversebody bias and supply collapse for low effective standby power" 12 (12): 947-956, 2004

      5 H.-O. Kim, "Physical design methodology of power gating circuits for standard-cell-based design" 109-113, 2006

      6 S. Borkar, "Parameter variations and impact on circuits and microarchitecture" 338-342, 2003

      7 B. Choi, "Lookup table-based adaptive body biasing of multiple macros" 533-538, 2007

      8 J.Y. Choi, "Lookup table based adaptive body biasing of multiple macros"

      9 S. G. Narendra, "Leakage in nanometer CMOS technologies" Springer- Verlag 2005

      10 K. Roy, "Leakage current mechanisms and leakage reduction techniques in deep-submicronmeter CMOS circuits" 92 (92): 305-327, 2003

      11 R. Chau, "High-k/Metal-gate stack and its MOSFET characteristics" 25 (25): 408-410, 2004

      12 L. Pileggi, "Exploring regular fabrics to optimize the performance cost trade-off" 782-787, 2003

      13 S. V. Kosonocky, "Enhanced multi-threshold (MTCMOS) circuits using variable well bias" 165-169, 2001

      14 L. L. C. Hsu, "Dynamic DRAM refresh rate adjustment based on cell leakage monitoring"

      15 M. Nomura, "Delay and power monitoring schemes for minimizing power consumption by means of supply and threshold voltage control in active and standby modes" 41 (41): 805-814, 2006

      16 T. Chen, "Comparison of adaptive body bias(ABB)and adaptive supply voltage(ASV)for improving delay and leakage under the presence of process variation" 11 (11): 888-899, 2003

      17 G. Gammie, "A 45nm 3.5G baseband-andmultimedia application processor using adaptive body-bias and ultra-low-power techniques" 258-259, 2008

      18 S. Mutoh, "A 1-V power supply high-speed digital circuit technology with multiple threshold-voltage CMOS" 30 (30): 847-854, 1995

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      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2014-01-21 학회명변경 영문명 : The Institute Of Electronics Engineers Of Korea -> The Institute of Electronics and Information Engineers KCI등재
      2010-11-25 학술지명변경 한글명 : JOURNAL OF SEMICONDUTOR TECHNOLOGY AND SCIENCE -> JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE KCI등재
      2010-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2009-01-01 평가 등재후보 1차 PASS (등재후보1차) KCI등재후보
      2007-01-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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