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Effects of Sn Layer Orientation on the Evolution of Cu/Sn Interfaces
Menglong Sun,Zhangjian Zhao,Fengtian Hu,Anmin Hu,Ming Li,Huiqin Ling,Tao Hang 대한금속·재료학회 2018 ELECTRONIC MATERIALS LETTERS Vol.14 No.4
The effects of Sn layer orientation on the evolution of Cu/Sn joint interfaces were investigated. Three Sn layers possessing(112), (321) and (420) orientations were electroplated on polycrystalline Cu substrates respectively. The orientations of Snlayer preserved during reflowing at 250 °C for 10 s. After aging at 150 °C for different time, the interfacial microstructureswere observed from the cross-section and top-view. The alignment between the c-axis of Sn and Cu diffusion direction significantlysped up the Cu diffusion, leading to the thickest intermetallic compound layer formed in (112) joint. Two types ofvoids, namely, intracrystalline voids and grain islanding caused intercrystalline voids generated at Cu/Cu3Sn interfaces dueto the different interdiffusion coefficients of Cu and Sn (112) oriented Sn/Cu joint produced many more voids than (321)joint, and no voids were detected in (420) joint. Therefore, to enhance the reliability of solder joints, using (420) orientedSn as solder layer could be an efficient way.