http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
Nanosilicon for single-electron devices
H. Mizuta,Y. Furuta,T. Kamiya,Y. T. Tan,Z.A.K. Durrani,S. Amakawa,K. Nakazato,H. Ahmed 한국물리학회 2004 Current Applied Physics Vol.4 No.2-4
This paper presents a brief overview of the physics of nanosilicon materials for single-electron device applications. We study howa nanosilicon grain and a discrete grain boundary work as a charging island and a tunnel barrier by using a point-contact transistor,which features an extremely short and narrow channel. Single-electron charging phenomena are investigated by comparing as-prepared devices and various oxidized devices. The optimization of grain and grain-boundary structural parameters is discussed forimproving the Coulomb blockade characteristics and realizing room temperature device operation.
Observation of interdot coupling phenomena in nanocrystalline silicon point-contact structures
M.A.H. Khalafalla,H. Mizuta,S. Oda,Z.A.K. Durrani 한국물리학회 2006 Current Applied Physics Vol.6 No.3
We have investigated the electrostatic and coherent couplings in 30 nm· 30 nm · 40 nm nanocrystalline silicon side gated point-con-tact transistors where the nanocrystalline silicon grains (1035 nm in size) formed naturally coupled quantum dots through the thin grainannealed devices showed switching of the Coulomb oscillation peaks that was associated with electrostatic coupling between two majornanocrystals embedded in the point-contact channel. We also observed in similar measurements, using an oxidised-only device, anenhanced switching of the peaks with additional peak structures in the switching region where the grains coupled strongly. The charac-teristics in this region were well tted to a sum of four Lorentzian peaks. These peaks were associated with coherent tunnelling of thebarriers.