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이상열,홍광준,유상하,신용진,이관교,서상석,김혜숙,윤은희,김승욱,박향숙,신영진,정태수,신현길,김택성,문종대,이충일,전승룡 ( S . Y . Lee,K . J . Hong,S . G . You,Y . j . Shin,K . K . See,S . S . Suh,H . S . Kim,E . H . Yun,S . U . Kim,H . S . Park,Y . 센서 한국센서학회 1995 센서학회지 Vol.4 No.3
Polycrystalline Cd_(1-x)Zn_xS thin film were grown on slide glass(corning-2948) substrate using a chemical bath deposition (C.B.D) method. They were annealed at various temperature and X-ray diffraction patterns were measured by X-ray diffractometor in order to study Cd_(1-x)Zn_xS polycrystal structure using extrapolation method of X-ray diffraction patterns for the CdS, ZnS sample annealed in N₂ gas at 550 ℃. It was found hexagonal structure which had the lattice constant a_o = 4.1364Å, c_o=6.7129Å in CdS and a_o = 3.8062Å, c_o = 6.2681 Å in ZnS, respectively. Hall effect on these sample was measured by Van der Pauw method and then studied on carrier density and mobility depending on temperature. We measured also spectral response, sensitivity maximum allowable power dissipation and response time on these sample