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Vapor-phase selective hydrogenation of maleic anhydride to succinic anhydride over Ni/TiO2 catalysts
Weitao Huo,Chunlei Zhang,Hongjing Yuan,Mingjun Jia,Chunli Ning,Yong Tang,Yi Zhang,Jiahuan Luo,Zhenlu Wang,Wenxiang Zhang 한국공업화학회 2014 Journal of Industrial and Engineering Chemistry Vol.20 No.6
A series of supported Ni/TiO2 catalysts were prepared by incipient wetness impregnation method underdifferent calcination temperatures, and the as-prepared catalysts were characterized by X-ray diffraction(XRD), hydrogen temperature-programmed reduction (H2-TPR) and X-ray photoelectron spectroscopy(XPS). The catalytic properties of these Ni/TiO2 catalysts were investigated in the vapor phasehydrogenation of maleic anhydride (MA) to succinic anhydride (SA). The results showed that thecatalytic activity and the selectivity of the Ni/TiO2 catalysts were strongly affected by the calcinationtemperature. The catalyst calcined at 1023 K showed a relatively higher SA selectivity of 96% at high MAconversion (96%) under the tested conditions (493 K and 0.2 MPa). The improvement of SA selectivitycould be mainly assigned to the presence of suitable metal–support interaction, which can play a role incatalytic property of active nickel species as electron promoter. Besides, the change of surface propertiesof TiO2 support with the increasing calcination temperatures, e.g., the decrease of Lewis acid sites, mightalso have some positive role in reducing the side-products like g-butyrolacetone (GBL).
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Weitao Su,Kaixin Song,Dexuan Huo,Bin Li 한국물리학회 2013 Current Applied Physics Vol.13 No.3
Optical and electrical analysis are required to clarify infrared reflection behavior of anatase Nb doped TiO2 (NTO) films, a novel transparent conductive oxide (TCO). In this paper, UVevis-near infrared transmission spectrum, Fourier transformed infrared (FTIR) reflection and ellipsometry analysis are conducted on anatase NTO films (Nb doping concentration: 6, 4 and 2 at%) deposited by pulse laser deposition (PLD). NTO samples show good transparency from 400 nm to 1000 nm, but no obvious plasmon induced high IR reflection even when wavelength >3000 nm. Assuming inhomogeneous resistivity (r) and mean scattering time (s) along film thickness, dielectric constants (εr, εi) and optical constants (n, k) are extracted by fitting spectroscopic ellipsometry using Code-Lorentz (CL) & Drude exponential model. It is shown that unique optical constants and small s (1.1e2.6 fs) intrinsically prevent NTO to be high infrared reflective TCO.
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