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NS3K : A 3nm Nanosheet FET Library for VLSI Prediction in Advanced Nodes
Taehak Kim,Jaehoon Jeong,Seungmin Woo,Jeonggyu Yang,Hyunwoo Kim,Ahyeon Nam,Changdong Lee,Jinmin Seo,Minji Kim,Siwon Ryu,Yoonju Oh,Taigon Song 대한전자공학회 2021 대한전자공학회 학술대회 Vol.2021 No.6
Nanosheet FETs (NSFETs) are expected as future devices that replace FinFETs beyond the 5nm node. Despite the importance of the devices, few studies report the impact of NSFETs in the full-chip level. Therefore, this paper presents NS3K, the first 3nm NSFET library, and presents the results in a full-chip scale. Based on our results, 3nm NSFET reduces power by -27.4%, total wirelength by -25.8%, number of cells by -8.5%, and area by -47.6% over 5nm FinFET, respectively, due to better devices and interconnect scaling. However, careful device/layout designs followed by routing-resource considering standard cells are required to maximize the advantages of 3nm technology.