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Chang, Hye Jung,Kalinin, Sergei V.,Morozovska, Anna N.,Huijben, Mark,Chu, Ying‐,Hao,Yu, Pu,Ramesh, Ramamoorthy,Eliseev, Evgeny A.,Svechnikov, George S.,Pennycook, Stephen J.,Borisevich, Albina Y WILEY‐VCH Verlag 2011 Advanced Materials Vol.23 No.21
<P><B>Direct atomic displacement mapping at ferroelectric interfaces</B> by aberration corrected scanning transmission electron microscopy(STEM) (a‐STEM image, b‐corresponding displacement profile) is combined with Landau‐Ginsburg‐Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions. </P>