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Suh, Youngsuk,Kim, Minjae,Ahn, Chang-hoi The Korean Institute of Electrical Engineers 2018 Journal of Electrical Engineering & Technology Vol.13 No.1
This article has been retracted at the request of the authors and/or the Editor in Chief. Reason: After the paper published, the authors have found that the intellectual property for this paper was a company's own. As a result, the authors have elected to withdraw the complete article with apologies to the scientific community
Youngsuk Suh,Minjae Kim,Chang-hoi Ahn 대한전기학회 2017 Journal of Electrical Engineering & Technology Vol.12 No.2
A novel AC direct light emitting diode (LED) driver circuit that uses flicker mitigation and the electromagnetic interference (EMI) noise reduction method is proposed in this study. This method is based on the current controls of the flicker mitigation capacitor using MOSFET. The core block of the proposed circuit is fabricated as an IC chip. LED lightings are fabricated with the IC chip. The lightings show a flicker index of 0.15, and a 20dBμV peak value and 35dBμV average value of conduction noise margin for EMI regulation. It can be applied to the low power and low cost single chip LED lightings.
Novel Flicker Migration and EMI Noise Reduction Circuit for AC Direct LED Lightings
Suh, Youngsuk,Kim, Minjae,Ahn, Chang-hoi 대한전기학회 2017 Journal of Electrical Engineering & Technology Vol.12 No.2
A novel AC direct light emitting diode (LED) driver circuit that uses flicker mitigation and the electromagnetic interference (EMI) noise reduction method is proposed in this study. This method is based on the current controls of the flicker mitigation capacitor using MOSFET. The core block of the proposed circuit is fabricated as an IC chip. LED lightings are fabricated with the IC chip. The lightings show a flicker index of 0.15, and a $20dB{\mu}V$ peak value and $35dB{\mu}V$ average value of conduction noise margin for EMI regulation. It can be applied to the low power and low cost single chip LED lightings.
독립성 검정의 역사적 고찰: χ² 검정부터 부스트래핑 방법까지
서영숙(Youngsuk Suh) 한국교육평가학회 2020 교육평가연구 Vol.33 No.2
1900년대 초 Pearson이 두 범주형 변수 간의 독립성을 확인하는 χ² 검정을 제안한 이래 지난 100여 년 동안 많은 비판과 논쟁 속에서 독립성 검정의 방법들이 발전해 왔다. Fisher가 χ² 검정의 자유도를 수정하고 정확검정을 제안함으로써 독립성 검정이 본격적으로 관심받고 경쟁을 시작했으며, 이후 Yates의 연속성 보정, Wilks의 우도비 검정, 즉 G검정의 제안이 있었고, 20세기 후반부터는 부스트래핑을 이용한 방법이 또한 조명을 받고 있다. 본 연구는 지금까지 많은 학자들에 의하여 연구된 주요한 독립성 검정들을 종합하여 고찰하고 각 방법의 역사적 의미와 원리 등을 살펴본다. 특히 상대적으로 가장 최근 제안된 부스트래핑 방법의 원리와 수행도에 대하여 살펴보고 적절한 이용방법을 제안한다. 마지막으로 선행 연구와 문헌의 역사적 고찰을 통하여 파악된 결과들을 바탕으로 어떤 조건에서 어떤 방법을 사용할지에 대한 간략한 가이드라인을 제공한다. Since Pearson introduced a method of testing independence between two categorical variables using χ² tests, some advances have been made for the methods of testing independence through discussions and criticism for about 100 years. Independence tests gained serious attention by Fisher who suggested a correction for the degrees of freedom in χ² tests and developed an exact test for independence. After that, a series of development, such as Yates’ continuity correction, Wilks’ likelihood-ratio test (i.e., G test), and a bootstrapping method, came to the fore. The present study investigates some major independence tests used by many researchers and provides historical meanings and principles of those tests. Especially, this study examines the principle and performance of the bootstrapping method introduced relatively recently and shows how to implement the method properly. Lastly, a brief guideline is presented for the selection and use of the independence tests based on the previous research.
파라메터 직접 추출법을 이용한 스케일 가능한 HBT의 모델링
서영석,Suh Youngsuk 한국정보통신학회 2005 한국정보통신학회논문지 Vol.9 No.2
새로운 전류원 모델과 이 전류원 모델에 대응하는 파라메터의 직접추출 방법을 제안하였다. 전류원 모델파라메터를 위한 정확하고 해석적인 계산방법을 유도하였다. 이러한 해석적 모델링 방법을 기반으로 스케일 가능한 H8T 모델을 만드는 방법에 적용되었다. 단조함수적 스케일링이 가능하도록 하도록 하기 위해, 모델링 과정에서, 몇몇 파라메터들의 증복성(redunduncy)을 제거하는 방법을 개발하였다. 이러한 방법에 기반을 둔 모델을 실제 소자에 적용 했을때, 소자의 온도, 바이어스 및 크기변화를 잘 예측할 수 있었다. A new HBT current source model and the corresponding direct parameter extraction methods are presented. Exact analytical expressions for the current source model parameters are derived. This method is applied to scalable modeling of HBT, Some techniques to reduce redundancy of the parameters are introduced. The model based on this method can accurately predict the measured data for the change of ambient temperature, size, and bias.
Toxic epidermal necrolysis induced by lamotrigine treatment in a child
Yi, Youngsuk,Lee, Jeong Ho,Suh, Eun Sook The Korean Pediatric Society 2014 Clinical and Experimental Pediatrics (CEP) Vol.57 No.3
Toxic epidermal necrolysis is an unpredictable and severe adverse drug reaction. In toxic epidermal necrolysis, epidermal damage appears to result from keratinocyte apoptosis. This condition is triggered by many factors, principally drugs such as antiepileptic medications, antibiotics (particularly sulfonamide), nonsteroidal anti-inflammatory drugs, allopurinol, and nevirapine. Lamotrigine has been reported potentially cause serious cutaneous reactions, and concomitant use of valproic acid with lamotrigine significantly increases this risk. We describe a case of an 11-year-old girl with tic and major depressive disorders who developed toxic epidermal necrolysis after treatment with lamotrigine, and who was diagnosed both clinically and pathologically. Children are more susceptible to lamotrigine-induced rash than adults, and risk of serious rash can be lessened by strict adherence to dosing guidelines. Unfortunately, in our case, the patient was administered a higher dose than the required regimen. Therefore, clinicians should strictly adhere to the dose regimen when using lamotrigine, especially in children.