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RISS 인기검색어
- 검색키워드
- 저자 : R. Razavi (검색결과 6 건)
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Energy and Temperature Dependences of the Spin Cutoff Parameter in 50 - 57Cr Isotopes
R. Razavi,A. Rashed Mohassel,A. Rahmatinejad,S. Mohammadi 한국물리학회 2018 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.73 No.10
The spin cutoff parameters of 50 - 57Cr isotopes have been calculated using a superconducting Hamiltonian with the inclusion of the pairing effect. Their energy and temperature dependences have been studied through comparison with some well-known semi-empirical formulae. This study shows that the microscopic calculation results converge to the Fermi gas model prediction at higher energies. Also, an even-odd effect is evident in the spin cutoff parameters at low temperatures and disappears after the pairing phase transition.
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PYROMILLING SYNTHESIS OF NANOCRYSTALLINE TITANIUM CARBIDE
M. RAZAVI,S. ZAMANI,M. R. RAHIMIPOUR,P. KHATIBZADEH 성균관대학교(자연과학캠퍼스) 성균나노과학기술원 2013 NANO Vol.8 No.2
For the first time, pyromilling synthesis for production of nanocrystalline titanium carbide was presented in this research. Raw materials containing stoichiometric ratio of titanium and carbon were milled and heated simultaneously. Samplings were done at different times. Then, phase transformation, crystallite size and strain of samples were estimated by XRD technique. Microstructures of milled samples were studied by SEM and TEM. Results showed that by increasing temperature, milling time for synthesizing of titanium carbide was reduced. Crystallite size of milled samples were in nanometer scale which were reduced by increasing of milling time and decreasing of temperature while strain was intensified. Existence of created strain changed lattice parameter of synthesized titanium carbide from standard value.
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Averaged strain energy density to assess mixed mode I/III fracture of U-notched GPPS samples
Saboori, Behnam,Torabi, A.R.,Berto, F.,Razavi, S.M.J. Techno-Press 2018 Structural Engineering and Mechanics, An Int'l Jou Vol.65 No.6
In the present contribution, fracture resistance of U-notched GPPS members under mixed mode I/III loading conditions is assessed by using the Averaged Strain Energy Density (ASED) criterion. This criterion has been founded based on the ASED parameter averaged over a well-defined control volume embracing the notch edge. The validation of the theoretical criterion predictions is evaluated through comparing with the results of a series of mixed mode I/III fracture tests conducted on rectangular-shaped GPPS specimens weakened by a single edge U-notch. A recently developed apparatus for mixed mode I/III fracture experiments is employed for measuring the fracture loads of the specimens. The test samples are fabricated with different notch tip radii with the aim of evaluating the influence of this major feature of the U-notched components on the mixed mode I/III fracture behavior. It is shown that the onset of brittle fracture in U-notched GPPS specimens under various combinations of tension and out-of-plane shear can well be predicted by means of the ASED criterion.
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Averaged strain energy density to assess mixed mode I/III fracture of U-notched GPPS samples
Behnam Saboori,A. R. Torabi,F. Berto,S. M. J. Razavi 국제구조공학회 2018 Structural Engineering and Mechanics, An Int'l Jou Vol.65 No.6
In the present contribution, fracture resistance of U-notched GPPS members under mixed mode I/III loading conditions is assessed by using the Averaged Strain Energy Density (ASED) criterion. This criterion has been founded based on the ASED parameter averaged over a well-defined control volume embracing the notch edge. The validation of the theoretical criterion predictions is evaluated through comparing with the results of a series of mixed mode I/III fracture tests conducted on rectangular-shaped GPPS specimens weakened by a single edge U-notch. A recently developed apparatus for mixed mode I/III fracture experiments is employed for measuring the fracture loads of the specimens. The test samples are fabricated with different notch tip radii with the aim of evaluating the influence of this major feature of the U-notched components on the mixed mode I/III fracture behavior. It is shown that the onset of brittle fracture in U-notched GPPS specimens under various combinations of tension and out-of-plane shear can well be predicted by means of the ASED criterion.
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Omid Fakheran,Reza Birang,Patrick R. Schmidlin,Sayed Mohammad Razavi,Parichehr Behfarnia 한국생체재료학회 2019 생체재료학회지 Vol.23 No.3
Objectives: Retro MTA is a fast setting Calcium silicate cement used in endodontic regeneration procedures in recent years. Beta-tricalcium phosphate (β-TCP) is another common biomaterial used for bone augmentation procedures. The present pilot study was undertaken to evaluate and compare the efficacy of Retro MTA and a mixture of Retro MTA / β-TCP for periodontal tissue regeneration. Materials and methods: In 4 beagle dogs, periodontal dehiscence type defects were created. In each side, one dehiscence defect was left empty as a control site and three treatment modalities were randomly applied for the others: Retro MTA covered with a collagen membrane, Retro MTA + β-TCP covered with a membrane and covering the defect with a membrane without any bone augmentation. After 8 weeks Animals were sacrificed and Histomorphometric and histologic analysis were conducted. Results: Histologic analysis showed more cementum formation for both Retro MTA+ β-TCP (3.74 ± 0.34 mm) and Retro MTA group (3.24 ± 0.56 mm) compared to control group 1 (1. 15 ± 0.45 mm) and control group 2 (0.78 ± 0.65 mm). Formation of newly formed bone and cementum in the experimental groups were significantly higher as compared to the control groups (P < 0.0001). Conclusions: Retro MTA or Retro MTA+ β-TCP covered with a collagen membrane resulted in regeneration of periodontal tissues. However, Retro MTA+ β-TCP showed tendency towards better results than the use of Retro MTA alone.
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NBTI and hot-carrier effects in accumulation-mode Pi-gate pMOSFETs
Lee, C.W.,Ferain, I.,Afzalian, A.,Yan, R.,Dehdashti, N.,Razavi, P.,Colinge, J.P.,Park, J.T. Pergamon Press 2009 Microelectronics reliability Vol.49 No.9
Negative bias temperature instability (NBTI) and hot-carrier induced device degradation in accumulation-mode Pi-gate pMOSFETs have been studied for different fin widths ranging from 20 to 40nm. The NBTI induced device degradation is more significant in narrow devices. This result can be explained by enhanced diffusion of hydrogen at the corners in multiple-gate devices. Due to larger impact ionization, hot-carrier induced device degradation is more significant in wider devices. Finally, hot-carrier induced device degradation rate is highest under stress conditions where V<SUB>GS</SUB>=V<SUB>TH</SUB>.
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