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Choi, S. G.,Aspnes, D. E.,Stoute, N. A.,Kim, Y. D.,Kim, H. J.,Chang, Y.-C.,Palmstrøm, C. J. WILEY-VCH Verlag 2008 Physica status solidi. PSS. A, Applications and ma Vol.205 No.4
<P>Spectroscopic ellipsometry is used to determine pseudodielectric function spectra 〈ϵ 〉 = 〈ϵ<SUB>1</SUB>〈 + i 〈ϵ<SUB>2</SUB>〈 of InAs<SUB>x</SUB> P<SUB>1–x </SUB> al-loy thin films from 1.5 to 6.0 eV at room temperature. The structures for the E<SUB>1</SUB>, E<SUB>1</SUB> + Δ<SUB>1</SUB>, E ′<SUB>0</SUB>, E<SUB>2</SUB>, and E ′<SUB>2</SUB> critical points (CPs) were observed in the data. We compare direct- and reciprocal-space methods of extracting CP energies E<SUB>g</SUB>. The direct-space values show less uncertainty, a result of how the two procedures use available information. Energies obtained are compared with the results of theoretical calculations using the linear augmented Slater-type orbital (LASTO) method. (© 2008 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)</P>