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표면 조성분석의 정량화를 위한 Pt - Co 합금박막 표준시료의 개발 및 공동분석
김경중(K. J. Kim),문대원(D. W. Moon),한명섭(M. S. Han),강희재(H. J. Kang),김준곤(J. K. Kim),한승희(S. H. Han),이중환(J. H. Lee),윤선진(S. J. Yun),신광수(K. S. Shin),김차연(C. Y. Kim),김태형(T. H. Kim),이동석(D. S. Lee),김영남(Y. N. Kim),최홍 한국진공학회(ASCT) 1998 Applied Science and Convergence Technology Vol.7 No.3
Si 기판 위에 3종의 Pt-Co 합금박막 (Pt66-Co34, Pt40-Co60, Pt18-Co82)과 순수한 Pt, Co 박막 시료를 제작하여 표면 조성분석의 정량화 및 표준화를 위한 표준시료로 제안하였다. in-situ X-ray photoelectron spectroscopy(XPS) 분석에 의해 증착된 이원 합금박막의 조성이 정확히 조절되었으며, 합금박막의 실제 조성은 유도결합플라즈마-원자방출분광법 (inductively coupled plasma-atomic emission spectroscopy: ICP-AES)과 러더퍼드 후방산란분광법 (Rutherford back-scattering spectrometry: RBS)에 의해 결정되었다. in-situ XPS 결과와 ICP에 의한 조성을 비교한 결과 매질 효과를 고려하면 비교적 정확한 조성을 구할 수 있음이 확인되었다. 이 시료를 이용한 XPS와 Auger electron spectroscopy(AES)에 의한 국내 공동분석 결과는 약 4% 내외의 큰 편차를 보이고 있지만, 평균 조성 값은 약 1%의 오차 범위 내에서 두 방법에 의한 결과가 서로 잘 일치하였다. 이온빔 스퍼터링에 의해 Pt 조성이 증가된 표면층이 형성되어 정확한 조성분석을 위해서는 선택스퍼터링에 의한 표면 변형을 정량적으로 이해하여야 함을 알았다. Pure Pt, Co and their alloy thin films with three different compositions (Pt66-Co34, Pt40-Co60 and Pt18-Co82) were deposited on Si(100) wafers and proposed as a set of certified reference materials (CRM) for the quantification and standardization of surface compositional analysis. The compositions of the binary alloy thin films were controlled by in-situ XPS analyses and the certified compositions of the films have been determined by ICP-AES and RBS analyses after thin film growth. Through comparison of the compositions determined by in-situ XPS with those by ICP, relatively accurate compositions could be obtained with a matrix effect correction. Standard deviations of XPS and AES round robin tests with the Pt-Co alloy thin films were large up to about 4%. On the other hand, the average compositions of the Pt-Co alloy thin films by two methods were in a good agreement within 1 %. The formation of a Pt rich surface layer by ion beam sputtering indicates that the surface modification by preferential sputtering must be understood for a better compositional analysis.
김택수(T. S. Kim),김종오(C. O. Kim),이중환(J. W. Lee),윤선진(S. J. Yun),김좌연(J. Y. Kim) 한국자기학회 1996 韓國磁氣學會誌 Vol.6 No.5
Thin films of Fe-Zr-N were fabricated by rf magnetron reactive sputtering method. The saturation magnetization and coercivity as functions of annealing temperature and partial pressure of nitrogen gas, effective permeability at high frequencies, and thermal stability were investigated. Magnetic softness was exhibited in the composition range of Fe_(72-78)Zr_(7-10)N_(15-18) which was boundary between polycrystalline and amorphous structure. These films exhibited magnetic softness with saturation magentic flux density of 1.55 T and effective permeability of about 3000 at 1 ㎒. These films also exhibited thermal stability by sustaining effective permeability of 2500 or above as the temperature was raised to 550 ℃. It is assumed that good magnetic softness is obtained because grain growth of α-Fe is prohibited due to the precipitation of ZrN nanocrystals. The grain sizes of α-Fe films were 40~50 Å and the grain sizes of ZrN nanocrystals were 10~15 Å.