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Machining Error Inspection of T-Spline Surface by On- Machine Measurement
Jintao Lai,Jianzhong Fu,Hongyao Shen,Wenfeng Gan,Zichen Chen 한국정밀공학회 2015 International Journal of Precision Engineering and Vol. No.
A new method for machining error inspection of T-spline surface by on-machine measurement (OMM) is investigated in this study. With the presented method, a relatively small number of sampling points are needed to evaluate the machining error of the surface. The sampling strategy based on the dominant of the control vertex is proposed. Based on the inspection data, the machined surfacecan be obtained through a T-spline surface reconstruction algorithm. Verification experiments showed that the inspection errorbetween the OMM method and the coordinate measuring machine (CMM) method is within 13.3%. Simulation results shows that thefitting error in critical area can be improved with less additional sampling points while the surface is presented in T-spline surface.
An Optical Graphene-silicon Resonator Phase Shifter Suitable for Universal Linear Circuits
Changling Liu,Jianping Wang,Hongyao Chen,Zizheng Li 한국광학회 2022 Current Optics and Photonics Vol.6 No.1
This paper describes the construction of a phase shifter with low loss and small volume. To construct it, we use the two graphene layers that are separated by a hexagonal boron nitride (hBN) and embedded in a silicon waveguide. The refractive index of the waveguide is adjusted by applying a bias voltage to the graphene sheet to create an optical phase shift. This waveguide is a compact device that only has a radius of 5 μm. It has a phase shift of 6π. In addition, the extinction ratio (ER) is 11.6 dB and the inser-tion loss (IL) is 0.031 dB. Due to its unique characteristics, this device has great potential in silicon onchip optical interconnection and all-optical multiple-input multiple-output processing.