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RISS 인기검색어
- 검색키워드
- 저자 : Carastro, Lawrence A. (검색결과 2 건)
- 무료
- 기관 내 무료
- 유료
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Extraction of Passive Device Model Parameters Using Genetic Algorithms
Yun, Il-Gu,Carastro, Lawrence A.,Poddar, Ravi,Brooke, Martin A.,May, Gary S.,Hyun, Kyung-Sook,Pyun, Kwang-Eui Electronics and Telecommunications Research Instit 2000 ETRI Journal Vol.22 No.1
The extraction of model parameters for embedded passive components is crucial for designing and characterizing the performance of multichip module (MCM) substrates. In this paper, a method for optimizing the extraction of these parameters using genetic algorithms is presented. The results of this method are compared with optimization using the Levenberg-Marquardt (LM) algorithm used in the HSPICE circuit modeling tool. A set of integrated resistor structures are fabricated, and their scattering parameters are measured for a range of frequencies from 45 MHz to 5 GHz. Optimal equivalent circuit models for these structures are derived from the s-parameter measurements using each algorithm. Predicted s-parameters for the optimized equivalent circuit are then obtained from HSPICE. The difference between the measured and predicted s-parameters in the frequency range of interest is used as a measure of the accuracy of the two optimization algorithms. It is determined that the LM method is extremely dependent upon the initial starting point of the parameter search and is thus prone to become trapped in local minima. This drawback is alleviated and the accuracy of the parameter values obtained is improved using genetic algorithms.
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Statistical Modeling of 3-D Parallel-Plate Embedded Capacitors Using Monte Carlo Simulation
Yun, Il-Gu,Poddar, Ravi,Carastro, Lawrence,Brooke, Martin,May, Gary S. Electronics and Telecommunications Research Instit 2001 ETRI Journal Vol.23 No.1
Examination of the statistical variation of integrated passive components is crucial for designing and characterizing the performance of multichip module (MCM) substrates. In this paper, the statistical analysis of parallel plate capacitors with gridded plates manufactured in a multilayer low temperature cofired ceramic (LTCC) process is presented. A set of integrated capacitor structures is fabricated, and their scattering parameters are measured for a range of frequencies from 50 MHz to 5 GHz. Using optimized equivalent circuits obtained from HSPICE, mean and absolute deviation is calculated for each component of each device model. Monte Carlo Analysis for the capacitor structures is then performed using HSPICE. Using a comparison of the Monte Carlo results and measured data, it is determined that even a small number of sample structures, the statistical variation of the component values provides an accurate representation of the overall capacitor performance.
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