RISS 학술연구정보서비스

검색
다국어 입력

http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.

변환된 중국어를 복사하여 사용하시면 됩니다.

예시)
  • 中文 을 입력하시려면 zhongwen을 입력하시고 space를누르시면됩니다.
  • 北京 을 입력하시려면 beijing을 입력하시고 space를 누르시면 됩니다.
닫기
    인기검색어 순위 펼치기

    RISS 인기검색어

      검색결과 좁혀 보기

      선택해제
      • 무료
      • 기관 내 무료
      • 유료
      • KCI등재후보

        TEM characterisation of GdN thin films

        W.R. McKenzie,P.R. Munroe,F. Budde,B.J. Ruck,S. Granville,H.J. Trodahl 한국물리학회 2006 Current Applied Physics Vol.6 No.3

        The rare-earth metal nitrides have been predicted to possess a wide range of electronic structures, ranging from ferromagnetic to half-metallic to semiconducting, which makes these materials attractive for a range of applications. In this study, GdN thin lms were growndetailed microstructural characterisation of these lms was carried out using a variety of techniques such as transmission electron micros-copy (TEM), Rutherford backscattering spectroscopy (RBS) and energy dispersive X-ray spectrometry. TEM analysis indicated the lmsare nano-crystalline, with crystallite sizes being aected by the ionisation state of the nitrogen atmosphere used. Sources of the lms’internal stress were discussed with a signicant amount of oxygen absorption, identied by RBS, being a probable cause. Electron dif-the lm.

      연관 검색어 추천

      이 검색어로 많이 본 자료

      활용도 높은 자료

      해외이동버튼