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Low-Frequency Acoustic Phonon Temperature Distribution in Electrically Biased Graphene
Jo, Insun,Hsu, I-Kai,Lee, Yong J.,Sadeghi, Mir Mohammad,Kim, Seyoung,Cronin, Stephen,Tutuc, Emanuel,Banerjee, Sanjay K.,Yao, Zhen,Shi, Li American Chemical Society 2011 Nano letters Vol.11 No.1
<P>On the basis of scanning thermal microscopy (SThM) measurements in contact and lift modes, the low-frequency acoustic phonon temperature in electrically biased, 6.7−9.7 μm long graphene channels is found to be in equilibrium with the anharmonic scattering temperature determined from the Raman 2D peak position. With ∼100 nm scale spatial resolution, the SThM reveals the shifting of local hot spots corresponding to low-carrier concentration regions with the bias and gate voltages in these much shorter samples than those exhibiting similar behaviors in the infrared emission maps.</P><P><B>Graphic Abstract</B> <IMG SRC='http://pubs.acs.org/appl/literatum/publisher/achs/journals/content/nalefd/2011/nalefd.2011.11.issue-1/nl102858c/production/images/medium/nl-2010-02858c_0004.gif'></P><P><A href='http://pubs.acs.org/doi/suppl/10.1021/nl102858c'>ACS Electronic Supporting Info</A></P>