http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
Dielectric Functions and Critical Points of GaAsSb Alloys
김태중,박한결,변준석,Van Long Le,Hoang Tung Nguyen,Xuan Au Nguyen,김영동,송진동,David E. Aspnes 한국물리학회 2019 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.74 No.6
We report the pseudodielectric functions and the critical points of GaAs$_x$Sb$_{1-x}$ ternary alloy films. Data were obtained by performing spectroscopic ellipsometry on 1-$\upmu$m-thick films grown on (001) GaAs by using molecular beam epitaxy. Artifacts from surface contaminants, including oxide overlayers, were minimized by using in-situ chemical cleaning, leading to accurate representations of the bulk dielectric responses of these materials. We determined the energies of the $E_1$, $E_1+\Delta_1$, $E_0'$, $E_0'+\Delta_0'$, $E_2$, $E_2'$, and $E_1'$ critical points from numerically calculated second energy derivatives, as well as their compositional dependences by using lineshape fitting.
Parameterization of the dielectric functions of InGaSb alloys
김태중,변준석,황순영,박한결,강유리,박재찬,김영동,David E. Aspnes 한국물리학회 2014 Current Applied Physics Vol.14 No.5
Analytic expressions are presented that accurately represent the dielectric functions ε ¼ ε1 þ iε2 of In1xGaxSb from 1.5 to 6 eV. We used the parametric model, which portrays ε as a sum of polynomials and can accommodate the asymmetric nature of critical point transitions. The ε spectra were obtained previously by spectroscopic ellipsometry for x ¼ 0.000, 0.102, 0.305, 0.473, 0.684, and 1.000. The ε data are successfully reconstructed and parameterized by eight polynomials. With the interpolation of parameters of ε spectra, we can determine ε as a continuous function of Ga composition and energy over the entire composition range 0 x 1. These results should be useful for device design and in situ monitoring of deposition.
Reducing or eliminating noise in ellipsometric spectra
Le Long V.,Kim Tae Jung,김영동,Aspnes David E. 한국물리학회 2022 THE JOURNAL OF THE KOREAN PHYSICAL SOCIETY Vol.81 No.5
In the last several years, considerable progress has been made in reducing or eliminating noise in ellipsometric spectra, including the development of algorithms for eliminating endpoint-discontinuity artifacts, a reciprocal-space expression for quantifying the efectiveness of linear flters, and the corrected maximum-entropy (CME) approach for eliminating apodization and its associated errors. These lead to new capabilities, together with additional opportunities for extracting information from spectra. These results enhance the utility of ellipsometry for analyzing surfaces, interfaces, materials, and structures. Examples are provided.