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유기금속증착법에 의한 $IN_1-x$$Ga_x$$As_y$$P_1-y$/INP의 성장시 성장변수가 에피층의 전기적, 광학적 특성에 미치는 영향
유지범,김정수,장동훈,박형호,오대곤,이용탁,Yu, Ji-Beom,Kim, Jeong-Soo,Chang, Dong-Hun,Park, Hyung-Ho,Oh, Dae-Gon,Lee, Yong-Tak 한국전자통신연구원 1991 전자통신 Vol.13 No.4
$In_1-x$$GA_X$$As_y$$P_1-y$ has a very wide range of applications in optoelectronic devices especially for optical communications because $In_1-x$$GA_X$$As_y$$P_1-y$ has the bandgap of the lowest dispersion ($1.3\mum$) and the lowest loss ( $1.55\mum$) of the optical fiber by changing the composition. The quality of $In_1-x$$GA_X$$As_y$$P_1-y$ epitaxial layer is believed to have a significant effect on the performance of device. The OMVPE growth conditions for the latticematched $In_1x$$GA_X$$As_y$$P_1-y$/InP were investigated. Effects of growth conditions such as V/III ratio, growth temperature, and Ga source material on the electrical and optical properties were studied. The composition, electrical and optical properities of $In_1-x$$GA_X$$As_y$$P_1-y$ were characterized using double crystal X-ray diffractometer (DCD), photoluminescence (PL), XPS(ESCA) and Hall measurement.