http://chineseinput.net/에서 pinyin(병음)방식으로 중국어를 변환할 수 있습니다.
변환된 중국어를 복사하여 사용하시면 됩니다.
가속수명시험 (ALT)을 이용한 WOLED의 성능 및 신뢰성 평가
문진철 ( Jin Chel Moon ),박형기 ( Hyung Ki Park ),최충석 ( Chung Seong Chol ) 한국안전학회(구 한국산업안전학회) 2012 한국안전학회지 Vol.27 No.4
The purpose of this study is to extract the major factors related to the deterioration mechanism of white organic light-emitting diodes (WOLED) by performing accelerated testing of temperature, voltage, time, etc., and to develop an accelerated life test (ALT) model. The measurement results of the brightness of the WOLED exhibited that their average brightness tended to increase as the operating voltage increased and that the half-life period of the brightness appeared after approximately 400 hours when the operating voltage was 20V and the ambient temperature was 85˚C. It could be seen that although the WOLED showed comparatively the same brightness when the initial acceleration began after the operating voltage was applied to it, its brightness changed excessively after the WOLED`s thermal storage had been made. In addition, it was observed that the half-life period was reduced as the ambient temperature and applied voltage increased. The strength of the WOLED which had been maintained in the range of visible light at the maximum load was reduced by the deterioration of the organic light emitting material due to the influence of the operating voltage and temperature, and the reduction of emitted light was small at low voltage and temperature. It could be seen that the failure of the WOLED during the ALT was caused by wear due to load accumulation over time, and that Weibull distribution was appropriate for the life distribution and acceleration was established between test conditions. From the WOLED analysis, it is thought that factors influencing the brightness deterioration are voltage, temperature, etc. and that comprehensive analysis considering discharge control, dielectric tangent margin, etc., would further increase the reliability.
가속수명시험을 이용한 조명용 WOLED의 수명예측에 관한 연구
최충석(Chung-Suk Choi),문진철(Jin-Chel Moon),박형기(Hung-Ki Park) 한국조명·전기설비학회 2010 한국조명·전기설비학회 학술대회논문집 Vol.2010 No.5월
This paper presents an accelerated life test for White Organic Emitting Diodes(WOLEDs), influence of several operating conditions on luminance degradation in full color organic lighting diodes has been investigated by the analysis of its luminance decay curve, the conditions varied were temperature(60℃, 80℃) and applied direct current voltage(16V, 20V). To estimate the degradation failure of WOLED device, an accelerated life test(ALT) was planned by temperature and voltage are selected as accelerating variables through the environment test about failure mechanism We assumed that Weibull lifetime distribution and a generalized linear model of life-stress relationship hold through goodness of fit test. Using ALT software, we estimated the common shape parameter of Weibull distribution, life-stress relationship, and accelerating factor. mean time between failure(MTBF) has a about 950 hours at room temperature and normal voltage.
김용하(Yong-Ha Kim),김의경(Ui-Gyeong Kim),유정희(Jeong-Hui Yoo),박종민(Jong-Min Park),문진철(Jin-Chel Moon),이혜선(Hye-Seon Lee) 한국조명·전기설비학회 2016 조명·전기설비학회논문지 Vol.30 No.7
Energy resources on the Earth may not be sufficient because more and more energy is needed for human beings as global economy grows further. Several alternatives being proposed to solve problems. Especially, CHP(Combined Heat and Power) is considered as the most realistic and efficient solution. This paper developed an optimal operation mechanism of connected system between the DHC(District Heating and Cooling). This operation system of DHC that is limited to power transaction can be expanded into the combined energy transaction including thermal transaction. This method can optimally operate connected systems and calculate the maximum profits by Dynamic Programing and Economic Heat Load Dispatch. Through the case studies, it is verified that the proposed algorithm is very realistic and effective.