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자기상관 데이터에서 표준방법과 붓스트랩 방법에 의한 X 관리도의 수행도에 관한 연구
송서일(Suh Ill Song),손한덕(Han Deck Shon) 대한설비관리학회 2000 대한설비관리학회지 Vol.5 No.2
N/A The existing statistical methods have been widely used to inspect, control and improve the product quality. Among this method, control chart developed by Shewhart is used in quality areas, as statistical method to translate and control the process. In rec
송서일 ( Suh Ill Song ),정혜진 ( Hey Jin Jung ) 한국품질경영학회 2002 품질경영학회지 Vol.30 No.4
Traditional SPC techniques are looking out variation of process by fixed sampling interval and fixed sample size about every hour, the process of in-control or out-of-control couldn`t be detected actually when the sample points are plotted near control limits, and it takes no notice of expense concerned with such sample points. In this paper, to overcome that, consider VSI(variable sampling interval) EWMA control charts which VSI method is applied. The VSI control charts use a short sampling internal if previous sample points are plotted near control limits, then the process has high probability of out-of-control. But it uses a long sampling interval if they are plotted near centerline of the control chart, since process has high possibility of in-control. And then a comparison and analysis between FSI(fixed sampling interval) and VSI EWMA in the statistical aspect and economic aspect is studied. Finally, we show that VSI EWMA control chart is more efficient than FSI EWMA control chart in the both aspects.
송서일 ( Suh Ill Song ),박현규 ( Hyun Kyu Park ) 한국품질경영학회 2005 품질경영학회지 Vol.33 No.1
This paper develops a new VSI X ̄-CRL synthetic control chart that considers convenience of use in the field, and perception of change of process applying VSI techniques to synthetic control chart, simultaneously. We found the optimal sampling interval and various control limit factor of the suggested chart using markov chain. Comparison and analysis is carried out between synthetic VSI X ̄-CRL chart and other chart in the statistical aspect; X ̄ control chart, VSI X ̄ chart, another synthetic chart. In case that the process follows normal distribution, the proposed VSI X ̄ -CRL synthetic control chart in detecting process mean shift showed the best performance in aspect of statistical performance, regardless of control limit L of CRL/S control chart.