아날로그 집적회로 결함 검출을 위한 새로운 검사방식

다국어 초록 (Multilingual Abstract)

This paper presents a new test technique for fault detection of analog integrated circuits. This test technique can detect various faults such as open, short, near open and near short from the fabrication step of analog integrated circuits. It is also capable of diagnosing specific faults from transistors, resistors, inductors, capacitors in integrated circuits, etc.. This technique discriminates defective or defect-free cases by measuring transient step current of power supply and output response, respectively. To verify performance of the proposed test technique, we designed wideband CMOS operational amplifier as a typical analog integrated circuits. It is designed using TSMC 0.18μm CMOS technology. The proposed technique showed an excellent fault detection capability of more than 99% from total 80 samples for various faults such as open, short, near open and near short. This test technique is inexpensive and simple.

참고문헌 (Reference)

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