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High-resolution transmission electron microscopy of semiconductor interfaces
Ishida, K. Institute of Physics Publishing 1995 p.1-10
Walther, T.;Boothroyd, C. B.;Humphreys, C. J. Institute of Physics Publishing 1995 p.11-16
Stenkamp, D.;Strunk, H. P. Institute of Physics Publishing 1995 p.17-22
Effect of the static atomic displacements in quantitative HREM of III-V alloys
Glas, F. Institute of Physics Publishing 1995 p.23-26
Hull, P. J.;Salata, O. V.;Hutchison, J. L.;Dobson, P. J. Institute of Physics Publishing 1995 p.27-30
TEM/HREM characterisation of self-organized (In,Ga)As quantum dots
Ruvimov, S.;Werner, P.;Scheerschmidt, K.;Richter, U. Institute of Physics Publishing 1995 p.31-34
Cerva, H.;Riechert, H.;Bernklau, D. Institute of Physics Publishing 1995 p.35-38
HREM-analysis of interfaces on the basis of molecular dynamic structure relaxations
Scheerschmidt, K.;Ruvimov, S.;Timpel, D. Institute of Physics Publishing 1995 p.39-42
The structure of interfaces in semiconductor low-dimensional systems grown by MBE
Gutakovski, A. K.;Aseev, A. L.;Hutchison, J. L. Institute of Physics Publishing 1995 p.43-46
Strain determination in bilayer systems using HREM
Robertson, M. D.;Corbett, J. M.;Currie, J. E.;Webb, J. B. Institute of Physics Publishing 1995 p.47-52