1 U. Choi, "Study on effect of junction temperature swing duration on lifetime of transfer molded power IGBT modules" 32 (32): 6434-6443, 2017
2 R. H. Baker, "Maximum efficiency switching circuits" MIT 1956
3 W. Lai, "Low ΔTj stress cycle effect in IGBT power module die-attach lifetime modeling" 31 (31): 6575-6585, 2016
4 Jeiotech, "Heating and cooling chamber LCH-11G"
5 R. Erickson, "Fundamentals of power electronics" Springer 1039-, 2020
6 L. Huber, "Effect of valley switching and switching-frequency limitation on line-current distortions of DCM/CCM boundary boost PFC converters" 24 (24): 339-347, 2009
7 A. Hanif, "Bond wire damage detection and SOH estimation of a dual-pack IGBT power module using active power cycling and reflectometry" 35 (35): 6761-6772, 2020
8 M. Heydarzadeh, "Bayesian remaining useful lifetime prediction of thermally aged power MOSFETs" 2718-2722, 2017
9 C. Chu, "Aging monitoring method of bond wires based on phase-frequency characteristics of differential mode conducted interference signal for IGBT module" 2021
10 U. Choi, "Advanced accelerated power cycling test for reliability investigation of power device modules" 31 (31): 8371-8386, 2016
1 U. Choi, "Study on effect of junction temperature swing duration on lifetime of transfer molded power IGBT modules" 32 (32): 6434-6443, 2017
2 R. H. Baker, "Maximum efficiency switching circuits" MIT 1956
3 W. Lai, "Low ΔTj stress cycle effect in IGBT power module die-attach lifetime modeling" 31 (31): 6575-6585, 2016
4 Jeiotech, "Heating and cooling chamber LCH-11G"
5 R. Erickson, "Fundamentals of power electronics" Springer 1039-, 2020
6 L. Huber, "Effect of valley switching and switching-frequency limitation on line-current distortions of DCM/CCM boundary boost PFC converters" 24 (24): 339-347, 2009
7 A. Hanif, "Bond wire damage detection and SOH estimation of a dual-pack IGBT power module using active power cycling and reflectometry" 35 (35): 6761-6772, 2020
8 M. Heydarzadeh, "Bayesian remaining useful lifetime prediction of thermally aged power MOSFETs" 2718-2722, 2017
9 C. Chu, "Aging monitoring method of bond wires based on phase-frequency characteristics of differential mode conducted interference signal for IGBT module" 2021
10 U. Choi, "Advanced accelerated power cycling test for reliability investigation of power device modules" 31 (31): 8371-8386, 2016
11 G. Stahl, "A high-efficiency bidirectional buck-boost DC-DC converter" 1362-1367, 2012