1 Mccaffrey JP, "Transmitted color and interference fringes for TEM sample preparation of silicon" 29 : 139-144, 1998
2 Goodhew PJ, "Thin foil preparation for electron microscopy in : Practical Methods in Electron Microscopy" Elsevier 1985
3 Newcomb SB, "The preparation of crosssectional TEM specimens" 93 : 43-, 1988
4 Barna ´A, "TEM sample preparation by ion milling/amorphization" 30 : 267-276, 1999
5 Strecker A, "Specimen preparation for transmission electron microscopy: Reliable method for cross-sections and brittle materials" 30 : 482-495, 1993
6 Okuno H, "Sample preparation of GaN-based materials on a sapphire substrate for STEM analysis" 57 : 1-5, 2008
7 Li J, "Recent advances in FIB-TEM specimen preparation techniques" 57 : 64-70, 2006
8 Egerton RF, "Radiation damage in the TEM and SEM" 35 : 399-409, 2004
9 Zilan L, "Preparation of GaN-based cross-sectional TEM specimens by laser lift-off" 36 : 281-284, 2005
10 Kim YM, "Practical approaches to minimize specimen charging effect in HRTEM" 63-67, 2008
1 Mccaffrey JP, "Transmitted color and interference fringes for TEM sample preparation of silicon" 29 : 139-144, 1998
2 Goodhew PJ, "Thin foil preparation for electron microscopy in : Practical Methods in Electron Microscopy" Elsevier 1985
3 Newcomb SB, "The preparation of crosssectional TEM specimens" 93 : 43-, 1988
4 Barna ´A, "TEM sample preparation by ion milling/amorphization" 30 : 267-276, 1999
5 Strecker A, "Specimen preparation for transmission electron microscopy: Reliable method for cross-sections and brittle materials" 30 : 482-495, 1993
6 Okuno H, "Sample preparation of GaN-based materials on a sapphire substrate for STEM analysis" 57 : 1-5, 2008
7 Li J, "Recent advances in FIB-TEM specimen preparation techniques" 57 : 64-70, 2006
8 Egerton RF, "Radiation damage in the TEM and SEM" 35 : 399-409, 2004
9 Zilan L, "Preparation of GaN-based cross-sectional TEM specimens by laser lift-off" 36 : 281-284, 2005
10 Kim YM, "Practical approaches to minimize specimen charging effect in HRTEM" 63-67, 2008
11 Yonenage I, "Hardness of bulk single-crystal GaN and AlN" 7 : 6-, 2002
12 Drory MD, "Hardness and fracture toughness of bulk single crystal gallium nitride" 69 : 4044-4046, 1996
13 Nakamura S, "GaN growth using GaN buffer layer" 30 : L1705-L1707, 1991
14 Weaver L, "Cross-section TEM sample preparation of multilayer and poorly adhering films" 36 : 368-371, 1997
15 Eberg E, "Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling" 57 : 175-179, 2008