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1 F. Wang, "Variation-aware Resource Sharing and Binding in Behavioral Synthesis" 79-84, 2009
2 Y. Chen, "Tolerating Process Variation in High-Level Synthesis Using Transparent Latches" 73-78, 2009
3 J.Jung, "Timing Variation-aware High- Level Synthesis Considering Accurate Yield Computation" 207-212, 2009
4 B. C. Paul, "Temporal performance degradation under NBTI: Estimation and design for improved reliability of nanoscale circuits" 780-785, 2006
5 C. Hongliang, "Statistical timing analysis under spatial correlations" 24 (24): 1467-1482, 2005
6 Xin Li, "Statistical Performance Modeling and Optimization" Lightining Source Inc 2007
7 Y.Xie, "Statistical High-Level Synthesis under Process Variability" 26 (26): 78-87, 2009
8 S. Bhardwaj, "Scalable model for predicting the effect of negative bias temperature instability forreliable design" 2 (2): 361-371, 2008
9 Sang Phill Park, "Reliabiliability Implications of Bias-Temperature Instability in Digital ICs" 26 (26): 8-17, 2009
10 L. Cheng, "Non-Linear Statistical Static Timing Analysis for Non-Gaussian Variation Sources" 250-255, 2007
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14 D. R. Bild, "Minimization of NBTI Performance Degradation Using Internal Node Control" 148-153, 2009
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16 "ITRS 2009 Design Roadmap"
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19 K. Gulati, "Fast Circuit Simuation on Graphics Processing Units" 403-408, 2009
20 X. Zhou, "DCCB and SCC based Fast Circuit Partition Algorithm for Parallel SPICE simulation" 1247-1250, 2009
21 X. Li, "Asymptotic Probability Extraction for Nonnormal ePerformance Distributions" 26 (26): 16-37, 2007
22 R. Kanj, "An Elegant Hardware-corroborated Statistical Repair and Test Methodology for Conquering Aging Effects" 497-504, 2009
23 S. Tsukiyama, "A statistical static timing analysis considering correlations between delays" 353-358, 2001
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