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      KCI등재 SCIE SCOPUS

      Timing Analysis Techniques Review for sub-30 nm Circuit Designs

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      https://www.riss.kr/link?id=A104287962

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      다국어 초록 (Multilingual Abstract)

      With scaled technology, timing analysis of circuits becomes more and more difficult. In this paper, we review recently developed circuit simulation techniques created to deal with the cost issues of transistor-level simulations. Various techniques for...

      With scaled technology, timing analysis of circuits becomes more and more difficult. In this paper, we review recently developed circuit simulation techniques created to deal with the cost issues of transistor-level simulations. Various techniques for fast SPICE simulations and Monte Carlo simulations are introduced. Moreover, process and aging variation issues are mentioned, along with promising methodologies.

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      참고문헌 (Reference)

      1 F. Wang, "Variation-aware Resource Sharing and Binding in Behavioral Synthesis" 79-84, 2009

      2 Y. Chen, "Tolerating Process Variation in High-Level Synthesis Using Transparent Latches" 73-78, 2009

      3 J.Jung, "Timing Variation-aware High- Level Synthesis Considering Accurate Yield Computation" 207-212, 2009

      4 B. C. Paul, "Temporal performance degradation under NBTI: Estimation and design for improved reliability of nanoscale circuits" 780-785, 2006

      5 C. Hongliang, "Statistical timing analysis under spatial correlations" 24 (24): 1467-1482, 2005

      6 Xin Li, "Statistical Performance Modeling and Optimization" Lightining Source Inc 2007

      7 Y.Xie, "Statistical High-Level Synthesis under Process Variability" 26 (26): 78-87, 2009

      8 S. Bhardwaj, "Scalable model for predicting the effect of negative bias temperature instability forreliable design" 2 (2): 361-371, 2008

      9 Sang Phill Park, "Reliabiliability Implications of Bias-Temperature Instability in Digital ICs" 26 (26): 8-17, 2009

      10 L. Cheng, "Non-Linear Statistical Static Timing Analysis for Non-Gaussian Variation Sources" 250-255, 2007

      1 F. Wang, "Variation-aware Resource Sharing and Binding in Behavioral Synthesis" 79-84, 2009

      2 Y. Chen, "Tolerating Process Variation in High-Level Synthesis Using Transparent Latches" 73-78, 2009

      3 J.Jung, "Timing Variation-aware High- Level Synthesis Considering Accurate Yield Computation" 207-212, 2009

      4 B. C. Paul, "Temporal performance degradation under NBTI: Estimation and design for improved reliability of nanoscale circuits" 780-785, 2006

      5 C. Hongliang, "Statistical timing analysis under spatial correlations" 24 (24): 1467-1482, 2005

      6 Xin Li, "Statistical Performance Modeling and Optimization" Lightining Source Inc 2007

      7 Y.Xie, "Statistical High-Level Synthesis under Process Variability" 26 (26): 78-87, 2009

      8 S. Bhardwaj, "Scalable model for predicting the effect of negative bias temperature instability forreliable design" 2 (2): 361-371, 2008

      9 Sang Phill Park, "Reliabiliability Implications of Bias-Temperature Instability in Digital ICs" 26 (26): 8-17, 2009

      10 L. Cheng, "Non-Linear Statistical Static Timing Analysis for Non-Gaussian Variation Sources" 250-255, 2007

      11 M. B. da Silva, "NBTI-aware technique for transistor sizing of high-performance CMOS gates" 1-5, 2009

      12 B. Vaidyanathan, "NBTI-aware statistical circuit delay assessment" 13-18, 2009

      13 C. Robert, "Monte Carlo Statistical Methods" Springer 2005

      14 D. R. Bild, "Minimization of NBTI Performance Degradation Using Internal Node Control" 148-153, 2009

      15 E. Pebesma, "Latin Hypercube Sampling of Gaussian random fields" 41 (41): 303-312, 1999

      16 "ITRS 2009 Design Roadmap"

      17 A. Singhee, "From Finance to Filp flops: A Study of fast quasi-Monte Carlo methods from Computational finance applied to Statistical Circuit Analysis" 685-692, 2007

      18 C. Visweswariah, "First-Order Incremental Block-Based Statistical Timing Analysis" 25 (25): 2170-2180, 2006

      19 K. Gulati, "Fast Circuit Simuation on Graphics Processing Units" 403-408, 2009

      20 X. Zhou, "DCCB and SCC based Fast Circuit Partition Algorithm for Parallel SPICE simulation" 1247-1250, 2009

      21 X. Li, "Asymptotic Probability Extraction for Nonnormal ePerformance Distributions" 26 (26): 16-37, 2007

      22 R. Kanj, "An Elegant Hardware-corroborated Statistical Repair and Test Methodology for Conquering Aging Effects" 497-504, 2009

      23 S. Tsukiyama, "A statistical static timing analysis considering correlations between delays" 353-358, 2001

      24 S. H. Kulkarni, "A Statistical Framework for Post-Silicon Tuning through Body Bias Clustering" 39-46, 2006

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      유사연구자 (20) 활용도상위20명

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2014-01-21 학회명변경 영문명 : The Institute Of Electronics Engineers Of Korea -> The Institute of Electronics and Information Engineers KCI등재
      2010-11-25 학술지명변경 한글명 : JOURNAL OF SEMICONDUTOR TECHNOLOGY AND SCIENCE -> JOURNAL OF SEMICONDUCTOR TECHNOLOGY AND SCIENCE KCI등재
      2010-01-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2009-01-01 평가 등재후보 1차 PASS (등재후보1차) KCI등재후보
      2007-01-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.42 0.13 0.35
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.3 0.29 0.308 0.03
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