Flexible electronics systems are increasingly adopted as future electronics technology due to its merits of cost, speed, density and performance. Although these flexible interconnect and embedded active structure are widely used in electronics applica...
Flexible electronics systems are increasingly adopted as future electronics technology due to its merits of cost, speed, density and performance. Although these flexible interconnect and embedded active structure are widely used in electronics application, poor interfacial adhesion between conductor metal and insulating polymer substrate lead to bottleneck of its wide application due to lack of long-term interfacial reliability at actual using conditions.
In this study, wet chemical pretreatment and Ar/O2 ion-beam pretreatment were introduced to improve interfacial adhesion between metal electrode and insulating polymer substrate, and interfacial adhesion was quantitatively measured by peel test. Surface analyses using AFM, FE-SEM and XPS were systematically performed to understand the fundamental adhesion mechanism which focuses on the mechanical interlocking and chemical bonding effect. Finally, we investigated quantitatively the correlation between interfacial adhesion and its fundamental adhesion mechanism as a function of surface pretreatment conditions.
Firstly, interfacial bonding mechanism between electroless-plated Ni and polyimide seems to be closely related the chemical bonding effect which is attributed to the functional carboxyl group by KOH→EDA treatment. By the way, post-baking process is a key step to get stable sample structure while this heat treatment at high temperature could lead to degradation of polyimide cohesive strength due to partially broken carbonyl bonding. Also, the fundamental adhesion mechanism with KOH+EDA treatment are similar to those with KOH→EDA treatment, which lead to cohesive failure inside polyimide itself rather than Ni/polyimide interface. Accordingly, KOH+EDA treatment can partially curtail pre-baking and KOH→EDA process without significantly decrease in the interfacial adhesion between electroless-plated Ni and polyimide. However, interfacial adhesion rapidly decreased with subsequent KMnO4 treatment, which is attributed to removal of the functional group such as carboxyl bonding. Therefore, it is speculated that functional carboxyl group plays an important role in fundamental bonding mechanism between the electroless-plated Ni and polyimide.
Secondly, interfacial bonding mechanism between sputter-deposited Cu and FR-4 substrate seems to be dominated by chemical bonding effect rather than mechanical interlocking effect by Ar/O2 ion-beam treatment. It is found that broken C-C bonding selectively reacted with O2 ions, resulting in strong interfacial bonding between sputter-deposited Cu and FR-4 substrate. Although desmear pretreatment has also caused strong interfacial bonding through selective reaction with carbon and oxygen through rearrangement of C-C bonding, interfacial adhesion between electroless-plated Cu and FR-4 substrate is relatively lower than sputter-deposited Cu on FR-4 treated by Ar/O2 ion-beam. Therefore, it is speculated that desmear pretreatment can result in extensive degradation of FR-4 cohesive strength as a main reason for lower interfacial adhesion than sputter-deposited Cu on FR-4 treated with Ar/O2 ion-beam.