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      KCI등재 SCI SCIE SCOPUS

      Influence of Grain Size and Room-Temperature Sputtering Condition on Optical and Electrical Properties of Undoped and Ga-Doped ZnO Thin Films

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      https://www.riss.kr/link?id=A104334320

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      다국어 초록 (Multilingual Abstract)

      The optical and the electrical properties of undoped zinc-oxide (ZnO) thin lms of various thicknesseswerecomparedwiththoseofGa-doped(GZO)thinlms. Transparent,high-qualityundoped ZnO and GZO lms were deposited successfully using radio-frequency (RF) sp...

      The optical and the electrical properties of undoped zinc-oxide (ZnO) thin lms of various thicknesseswerecomparedwiththoseofGa-doped(GZO)thinlms. Transparent,high-qualityundoped ZnO and GZO lms were deposited successfully using radio-frequency (RF) sputtering at room temperature. The lms were polycrystalline with a hexagonal structure and a strongly preferred orientation along the c-axis. The lms had an average optical transmission >85 % in the visible partoftheelectromagneticspectrum. TheundopedZnOthinlmsweremoretransparentthanthe GZO thin lms. The ZnO thin-lm transistors (TFTs) were operated in the enhancement mode withathresholdvoltageof2.5V.Incontrary,theGa-dopedZnOTFTswereoperatedinadepletion mode with a threshold voltage of {3.4 V. We successfully demonstrated undoped and the Ga-doped ZnO TFTs by using conventional SiO2 gate insulators at room temperature. We postulate that undoped ZnO lms, which have not been treated to improve the optical properties, can be used, instead of doped ZnO lms, in transparent devices for next generation optoelectronic devices.

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      다국어 초록 (Multilingual Abstract)

      The optical and the electrical properties of undoped zinc-oxide (ZnO) thin films of various thicknesses were compared with those of Ga-doped (GZO) thin films. Transparent, high-quality undoped ZnO and GZO films were deposited successfully using radio-...

      The optical and the electrical properties of undoped zinc-oxide (ZnO) thin films of various thicknesses were compared with those of Ga-doped (GZO) thin films. Transparent, high-quality undoped ZnO and GZO films were deposited successfully using radio-frequency (RF) sputtering at room temperature. The films were polycrystalline with a hexagonal structure and a strongly preferred orientation along the $c$-axis. The films had an average optical transmission $>$85 \% in the visible part of the electromagnetic spectrum. The undoped ZnO thin films were more transparent than the GZO thin films. The ZnO thin-film transistors (TFTs) were operated in the enhancement mode with a threshold voltage of 2.5 V. In contrary, the Ga-doped ZnO TFTs were operated in a depletion mode with a threshold voltage of --3.4 V. We successfully demonstrated undoped and the Ga-doped ZnO TFTs by using conventional SiO$_2$ gate insulators at room temperature. We postulate that undoped ZnO films, which have not been treated to improve the optical properties, can be used, instead of doped ZnO films, in transparent devices for next generation optoelectronic devices.

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      참고문헌 (Reference)

      1 C. Y. Kagan, "Thin Film Transistors" Dekker,New York 2003

      1 C. Y. Kagan, "Thin Film Transistors" Dekker,New York 2003

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      유사연구자 (20) 활용도상위20명

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      학술지 이력

      학술지 이력
      연월일 이력구분 이력상세 등재구분
      2023 평가예정 해외DB학술지평가 신청대상 (해외등재 학술지 평가)
      2020-01-01 평가 등재학술지 유지 (해외등재 학술지 평가) KCI등재
      2011-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2009-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2007-01-01 평가 SCI 등재 (등재유지) KCI등재
      2005-01-01 평가 등재학술지 유지 (등재유지) KCI등재
      2002-07-01 평가 등재학술지 선정 (등재후보2차) KCI등재
      2000-01-01 평가 등재후보학술지 선정 (신규평가) KCI등재후보
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      학술지 인용정보

      학술지 인용정보
      기준연도 WOS-KCI 통합IF(2년) KCIF(2년) KCIF(3년)
      2016 0.47 0.15 0.31
      KCIF(4년) KCIF(5년) 중심성지수(3년) 즉시성지수
      0.26 0.2 0.26 0.03
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