Thickness dependence of transport properties in high rate in-situ grown YBa2Cu3O7-x coated conductors

다국어 초록 (Multilingual Abstract)

We report depth proling of the critical current density and resistivity of YBa2Cu3O7lms
grown by in-situ electron beam evaporation. The method is capable of providing important information
on the uniformity of the lms, and on the commonly observed property that the critical
currents of coated conductor high temperature superconductor lms do not scale linearly with thickness.
Local critical current density shows a clear correlation with local resistivity. Homogeneous
transport properties with a large critical current density (4 5 MA/cm2 at 77 K, 0 T) are observed
in the top faulted region, while it is found that the bottom part carries little supercurrent with a
large local resistivity. Therefore, it is possible that thickness dependence of critical current density
is a topological variation of good superconducting paths and/or grains in the thin-lm bodies. The
information derived may be useful in the characterization and optimization of superconducting thin
lms for electrical power and other applications.

참고문헌 (Reference)

1 "Advances on Superconductivity VIII." Springer Verlag,Tokyo, 1029-, 1996