측면자극 DC필드에서 수정진동자의 두께 모우드에 관한 연구 = The Thickness Modes of a Quartz plate Resonator in a Lateral

다국어 초록 (Multilingual Abstract)

The fundamental thickness modes of a quartz plate resonator of orientation (XZIW)105.07/9.24 with frequncies of between 2.6 and 4.9 MHz were studied under the effect of a dc electric field E applied to the body of the resonator in the lateral direction, For each mode of vibration ensuing fuequency changes depend on the direction of the DC field. For dc fields of fixed directions, the fuequency dependance was found to be predominatly linear, with (1/f) (df/dE) at E = 0 of the order of 10 Vm was also detected. This compared well with the magnitude of the same phenomenon known for the dc fields applied in the thickness direction of quartz resonators in genaral.