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이 학술지의 논문 검색
Charge Collection Scanning Microscopy: Non-Conventional Applications
Castaldini, A. SCI TECH PUBLICATIONS LTD 1998 p.1-12
EBIC Study of Field Effect Transistors on Modulation-Doped AlGaAs/InGaAs/GaAs Heterostructures
Sieber, B. SCI TECH PUBLICATIONS LTD 1998 p.13-24
EBIC of Strained Si/SiGe 2DEGs Showing Lateral Electron Confinement
Norman, C. E. SCI TECH PUBLICATIONS LTD 1998 p.25-32
Laser Induced Mapping for Separation of Bulk and Surface Recombination
Ostendorf, H.-C. SCI TECH PUBLICATIONS LTD 1998 p.33-44
Donolato, C. SCI TECH PUBLICATIONS LTD 1998 p.45-52
Detection and Characterisation of "Sleeping" Defects in Silicon by LBIC Scan Maps at 80 K
Martinuzzi, S. SCI TECH PUBLICATIONS LTD 1998 p.53-60
Combined MOS/EBIC and Tem Study of Electrically Active Defects in SOI Wafers
Kononchuk, O. SCI TECH PUBLICATIONS LTD 1998 p.61-68
Characterization of Laser Structures by EBIC Measurements and Simulation
Rechenberg, I. SCI TECH PUBLICATIONS LTD 1998 p.69-76
Kittler, M. SCI TECH PUBLICATIONS LTD 1998 p.77-88
Monte Carlo Simulation of the Recombination Contrast of Dislocations
Tabet, N. SCI TECH PUBLICATIONS LTD 1998 p.89-96